U.S. flag

An official website of the United States government

Dot gov

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Https

Secure .gov websites use HTTPS
A lock () or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Breadcrumb

  1. Home

4D-STEM characterization results from a thermal annealing series of poly(3[2-(2-methoxyethoxy)ethoxy]-methylthiophene-2,5-diyl) organic electrochemical transistor films

This repository contains two types of datasets: 4D-STEM data collected from a thermal annealing series of P3MEEMT films. 4D-STEM data:Dose series: Collected from P3MEEMT film annealed at 115 C. Each HDF5 file was generated from the raw data using the fpdpy software package to reshape and embed metadata. No other preprocessing was performed. Annealing series: Collected from P3MEEMT films annealed at 75 C, 115 C, 145 C, and 175 C. Each temperature contains two sets of 4D-STEM data collected at low and high magnification. Each of these includes: the fpdpy generated HDF5 file, the EMI/SER file pair produced by the microscope imaging software (FEI TIA), and an HDF5 file containing some pre-processing results of the raw 4D-STEM data.

About this Dataset

Updated: 2024-02-22
Metadata Last Updated: 2023-05-19 00:00:00
Date Created: N/A
Views:
Data Provided by:
Advanced Materials
Dataset Owner: N/A

Access this data

Contact dataset owner Landing Page URL
Download URL
Table representation of structured data
Title 4D-STEM characterization results from a thermal annealing series of poly(3[2-(2-methoxyethoxy)ethoxy]-methylthiophene-2,5-diyl) organic electrochemical transistor films
Description This repository contains two types of datasets: 4D-STEM data collected from a thermal annealing series of P3MEEMT films. 4D-STEM data:Dose series: Collected from P3MEEMT film annealed at 115 C. Each HDF5 file was generated from the raw data using the fpdpy software package to reshape and embed metadata. No other preprocessing was performed. Annealing series: Collected from P3MEEMT films annealed at 75 C, 115 C, 145 C, and 175 C. Each temperature contains two sets of 4D-STEM data collected at low and high magnification. Each of these includes: the fpdpy generated HDF5 file, the EMI/SER file pair produced by the microscope imaging software (FEI TIA), and an HDF5 file containing some pre-processing results of the raw 4D-STEM data.
Modified 2023-05-19 00:00:00
Publisher Name National Institute of Standards and Technology
Contact mailto:andrew.herzing@nist.gov
Keywords Advanced Materials , Organic Semiconductors , 4D-STEM , OECT , TEM , GIWAXS
{
    "identifier": "ark:\/88434\/mds2-3060",
    "accessLevel": "public",
    "contactPoint": {
        "hasEmail": "mailto:andrew.herzing@nist.gov",
        "fn": "Andrew Herzing"
    },
    "programCode": [
        "006:045"
    ],
    "@type": "dcat:Dataset",
    "landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-3060",
    "description": "This repository contains two types of datasets: 4D-STEM data collected from a thermal annealing series of P3MEEMT films. 4D-STEM data:Dose series: Collected from P3MEEMT film annealed at 115 C.  Each HDF5 file was generated from the raw data using the fpdpy software package to reshape and embed metadata.  No other preprocessing was performed.  Annealing series: Collected from P3MEEMT films annealed at 75 C, 115 C, 145 C, and 175 C.   Each temperature contains two sets of 4D-STEM data collected at low and high magnification.  Each of these includes: the fpdpy generated HDF5 file, the EMI\/SER file pair produced by the microscope imaging software (FEI TIA), and an HDF5 file containing some pre-processing results of the raw 4D-STEM data.",
    "language": [
        "en"
    ],
    "title": "4D-STEM characterization results from a thermal annealing series of poly(3[2-(2-methoxyethoxy)ethoxy]-methylthiophene-2,5-diyl) organic electrochemical transistor films",
    "distribution": [
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3060\/P3MEEMT_4DSTEM_AnnealingSeries_175C.tar.gz",
            "mediaType": "application\/gzip",
            "title": "P3MEEMT_4DSTEM_AnnealingSeries_175C.tar"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3060\/P3MEEMT_4DSTEM_DoseSeries.tar.gz",
            "mediaType": "application\/gzip",
            "title": "P3MEEMT_4DSTEM_DoseSeries.tar"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3060\/P3MEEMT_4DSTEM_AnnealingSeries_75C.tar.gz",
            "mediaType": "application\/gzip",
            "title": "P3MEEMT_4DSTEM_AnnealingSeries_75C.tar"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3060\/P3MEEMT_4DSTEM_AnnealingSeries_115C.tar.gz",
            "mediaType": "application\/gzip",
            "title": "P3MEEMT_4DSTEM_AnnealingSeries_115C.tar"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3060\/P3MEEMT_4DSTEM_AnnealingSeries_145C.tar.gz",
            "mediaType": "application\/gzip",
            "title": "P3MEEMT_4DSTEM_AnnealingSeries_145C.tar"
        }
    ],
    "license": "https:\/\/www.nist.gov\/open\/license",
    "bureauCode": [
        "006:55"
    ],
    "modified": "2023-05-19 00:00:00",
    "publisher": {
        "@type": "org:Organization",
        "name": "National Institute of Standards and Technology"
    },
    "accrualPeriodicity": "irregular",
    "theme": [
        "Materials:Materials characterization",
        "Materials:Polymers",
        "Electronics:Semiconductors",
        "Electronics:Organic electronics"
    ],
    "issued": "2023-11-07",
    "keyword": [
        "Advanced Materials",
        "Organic Semiconductors",
        "4D-STEM",
        "OECT",
        "TEM",
        "GIWAXS"
    ]
}

Was this page helpful?