{
    "identifier": "ark:\/88434\/mds2-3060",
    "accessLevel": "public",
    "contactPoint": {
        "hasEmail": "mailto:[email protected]",
        "fn": "Andrew Herzing"
    },
    "programCode": [
        "006:045"
    ],
    "landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-3060",
    "title": "4D-STEM characterization results from a thermal annealing series of poly(3[2-(2-methoxyethoxy)ethoxy]-methylthiophene-2,5-diyl) organic electrochemical transistor films",
    "description": "This repository contains two types of datasets: 4D-STEM data collected from a thermal annealing series of P3MEEMT films. 4D-STEM data:Dose series: Collected from P3MEEMT film annealed at 115 C.  Each HDF5 file was generated from the raw data using the fpdpy software package to reshape and embed metadata.  No other preprocessing was performed.  Annealing series: Collected from P3MEEMT films annealed at 75 C, 115 C, 145 C, and 175 C.   Each temperature contains two sets of 4D-STEM data collected at low and high magnification.  Each of these includes: the fpdpy generated HDF5 file, the EMI\/SER file pair produced by the microscope imaging software (FEI TIA), and an HDF5 file containing some pre-processing results of the raw 4D-STEM data.",
    "language": [
        "en"
    ],
    "distribution": [
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3060\/P3MEEMT_4DSTEM_AnnealingSeries_175C.tar.gz",
            "mediaType": "application\/gzip",
            "title": "P3MEEMT_4DSTEM_AnnealingSeries_175C.tar"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3060\/P3MEEMT_4DSTEM_DoseSeries.tar.gz",
            "mediaType": "application\/gzip",
            "title": "P3MEEMT_4DSTEM_DoseSeries.tar"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3060\/P3MEEMT_4DSTEM_AnnealingSeries_75C.tar.gz",
            "mediaType": "application\/gzip",
            "title": "P3MEEMT_4DSTEM_AnnealingSeries_75C.tar"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3060\/P3MEEMT_4DSTEM_AnnealingSeries_115C.tar.gz",
            "mediaType": "application\/gzip",
            "title": "P3MEEMT_4DSTEM_AnnealingSeries_115C.tar"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3060\/P3MEEMT_4DSTEM_AnnealingSeries_145C.tar.gz",
            "mediaType": "application\/gzip",
            "title": "P3MEEMT_4DSTEM_AnnealingSeries_145C.tar"
        }
    ],
    "bureauCode": [
        "006:55"
    ],
    "modified": "2023-05-19 00:00:00",
    "publisher": {
        "@type": "org:Organization",
        "name": "National Institute of Standards and Technology"
    },
    "theme": [
        "Materials:Materials characterization",
        "Materials:Polymers",
        "Electronics:Semiconductors",
        "Electronics:Organic electronics"
    ],
    "keyword": [
        "Advanced Materials",
        "Organic Semiconductors",
        "4D-STEM",
        "OECT",
        "TEM",
        "GIWAXS"
    ]
}