{
    "identifier": "ark:\/88434\/mds2-3603",
    "accessLevel": "public",
    "contactPoint": {
        "hasEmail": "mailto:[email protected]",
        "fn": "Jeremy Thomas"
    },
    "programCode": [
        "006:045"
    ],
    "landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-3603",
    "title": "Cryogenic On-chip In Situ S-parameter Calibration using Superconducting Coplanar Waveguides",
    "description": "These data will appear in [1]. The abstract for that paper is given below:This paper presents an in situ S-parameter calibration technique using on-chip superconducting transmission lines at 4 K. The method uses coplanar waveguide (CPW) models based on various impedance states of niobium (Nb), which has zero dc resistance below 9 K and a monotonically increasing resistance from 10 K to room temperature. These impedance states are accessed by heating the 4 K stage of a cryostat and injecting up to 185 mA of current into the line and are used to solve for the unknowns in an 8-term error model using a least-squares analysis. We demonstrate this calibration method using Nb CPWs with and without embedded Josephson junctions (JJs), achieving S-parameter calibrations with self-consistency better than 0.1 dB from dc to 3 GHz.[1] Thomas, J. N., Hoffmann, J., Flowers-Jacobs, N. E., Fox, A. E., Johnson-Wilke, R. L., Dresselhaus, P. D., & Benz, S. P., \"Cryogenic On-chip In Situ S-parameter Calibration using Superconducting Coplanar Waveguides\" submitted to the IEEE Transactions on Microwave Theory and Techniques Journal which if accepted will be published and available on IEEE website at a later date.",
    "language": [
        "en"
    ],
    "distribution": [
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3603\/Fig5CPWResultData.csv",
            "description": "Data for Fig. 5 of [1]: Linear magnitude of the transmission coefficients for the corrected measured data (|Sn,calib,21|, solid lines) and the standards (|Sn,CPW,21|, dotted lines) versus frequency for the CPW without JJs. For the superconducting CPW (n = 0), only S0,CPW,21 is plotted because S0,calib is defined as S0,CPW. The first resonance at approximately 5 GHz is due to the cavity formed between the sets of wire bonds on the two sides of the chip. Other resonances arise from the coaxial-to-CPW transitions and resonance coupling. The transmission magnitude of the resistive states (n > 0) is primarily determined by the dc resistance of the 600 nm thick niobium wiring layer.",
            "mediaType": "text\/csv",
            "title": "Fig5CPWResultData"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3603\/Fig6CPWJJResultData.csv",
            "description": "Data for Fig. 6 of [1]: Linear magnitude of the transmission coefficients for the corrected measured data (|Sn,calib,21|, solid lines) and the standards (|Sn,CPW,21|, dotted lines) versus frequency for the CPW with embedded JJs. For the superconducting CPW (n = 0), only S0,CPW,21 is plotted because S0,calib is defined as S0,CPW. The resonances are slightly shifted compared to Fig. 5, but the causes remain the same. The transmission magnitude of the resistive states (n > 0) is increased compared to Fig. 5 due to higher dc resistance from the JJs and greater use of the 300 nm thick base electrode.",
            "mediaType": "text\/csv",
            "title": "Fig6CPWJJResultData"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3603\/Fig7CPWJJResult6GHzData.csv",
            "description": "Data for Fig. 7 of [1]: The same data from Fig. 6, with the same legend, is plotted with logarithmic magnitude and zoomed to show resistive states (n > 0) up to the first resonance. Dashed lines show the difference ((|Sn,CPW,21|\/|Sn,calib,21| in dB) between the corrected measured data (|Sn,calib,21|, solid lines) and the standards (|Sn,CPW,21|, dotted lines). The 10 K state (red dashed line) at 1 mA differs noticeably from the 25 K states (other dashed lines).",
            "mediaType": "text\/csv",
            "title": "Fig7CPWJJResult6GHzData"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3603\/Fig8CPWJJResultS11Data.csv",
            "description": "Data for Fig. 8 of [1]: The linear magnitude of the reflection coefficients for the corrected measured data (|Sn,calib,11|, solid lines) and the standards (|Sn,CPW,11|, dotted lines) versus frequency for the CPW with JJs. For the superconducting CPW (n = 0), only |S0,CPW,11| is plotted because S0,calib is defined as S0,CPW. The legend from Fig. 6 applies here.",
            "mediaType": "text\/csv",
            "title": "Fig8CPWJJResultS11Data"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3603\/Fig9TempTestData.csv",
            "description": "Data for Fig. 9 of [1]: Frequency dependence of the difference in |S21| between two states with nearly identical dc resistance but different heating mechanisms. S21 10 K: Cryostat at 10 K with 85 mA dc current, 88.5 Ohms resistance. S21 25 K: Cryostat at 25 K with 1 mA dc current, 88.47 Ohms resistance.",
            "mediaType": "text\/csv",
            "title": "Fig9TempTestData"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3603\/Readme.txt",
            "description": "Overview and descriptions of files in this dataset.",
            "mediaType": "text\/plain",
            "title": "README"
        }
    ],
    "bureauCode": [
        "006:55"
    ],
    "modified": "2024-11-19 00:00:00",
    "publisher": {
        "@type": "org:Organization",
        "name": "National Institute of Standards and Technology"
    },
    "theme": [
        "Electronics:Superconducting electronics",
        "Metrology:Electrical\/electromagnetic metrology"
    ],
    "keyword": [
        "Superconducting circuits",
        "cryogenic calibration",
        "microwave metrology",
        "S-parameters",
        "Josephson junctions."
    ]
}