Data from figure 4 "Measuring photonic optomechanical devices" in manuscript "Integrated photonic optomechanical atomic force microscopy probes batch fabricated using deep UV photolithography," in Journal of Microelectromechanical Systems, doi: 10.1109/JMEMS.2023.3247300.
About this Dataset
| Title | Data for manuscript: Integrated photonic optomechanical atomic force microscopy probes batch fabricated using deep UV photolithography |
|---|---|
| Description | Data from figure 4 "Measuring photonic optomechanical devices" in manuscript "Integrated photonic optomechanical atomic force microscopy probes batch fabricated using deep UV photolithography," in Journal of Microelectromechanical Systems, doi: 10.1109/JMEMS.2023.3247300. |
| Modified | 2022-10-10 00:00:00 |
| Publisher Name | National Institute of Standards and Technology |
| Contact | mailto:[email protected] |
| Keywords | integrated photonics , cavity optomechanical sensors |
{
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"fn": "Vladimir Aksyuk"
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"title": "Data for manuscript: Integrated photonic optomechanical atomic force microscopy probes batch fabricated using deep UV photolithography",
"description": "Data from figure 4 \"Measuring photonic optomechanical devices\" in manuscript \"Integrated photonic optomechanical atomic force microscopy probes batch fabricated using deep UV photolithography,\"\u00a0in\u00a0Journal of Microelectromechanical Systems, doi: 10.1109\/JMEMS.2023.3247300.",
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"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2815\/Fig4b_experimental_data.csv",
"description": "Broad wavelength scan for transverse magnetic (TM) polarized modes of a typical disk-cantilever device (w = 150 nm, G = 180 nm )",
"mediaType": "text\/csv",
"title": "Experimental data for figure 4(b)"
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"description": "High-Q optical resonance indicated with an red arrow in (b)",
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"title": "Experimental data for Figure 4c"
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{
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"description": "Lorentzian fit Q=64000",
"mediaType": "text\/csv",
"title": "Fit data for Figure 4c"
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{
"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2815\/Fig4d_experimental_data_10um.csv",
"description": "Transducer non-contact noise spectral density S_d for two devices with different dimensions. Device with a 10 micrometer disk (upper, red) presents a lowest in-plane mode eigenfrequency of ?_0\/2? ? 5 MHz and damping coefficient ?\/2? ? 0.34 MHz while the 5 micrometer disk device (lower, blue) presents ?_0\/2? ? 25 MHz and damping coefficient ?\/2? ? 0.28 MHz.",
"mediaType": "text\/csv",
"title": "Experimental data for figure 4d, 10 micrometer disk."
},
{
"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2815\/Fig4d_experimental_data_5um.csv",
"description": "Transducer non-contact noise spectral density S_d for two devices with different dimensions. Device with a 10 micrometer disk (upper, red) presents a lowest in-plane mode eigenfrequency of ?_0\/2? ? 5 MHz and damping coefficient ?\/2? ? 0.34 MHz while the 5 micrometer disk device (lower, blue) presents ?_0\/2? ? 25 MHz and damping coefficient ?\/2? ? 0.28 MHz.",
"mediaType": "text\/csv",
"title": "Experimental data for Figure 4d, 5 micrometer disk"
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"theme": [
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}