{
    "identifier": "ark:\/88434\/mds2-3212",
    "accessLevel": "public",
    "contactPoint": {
        "hasEmail": "mailto:[email protected]",
        "fn": "Cole Gray"
    },
    "programCode": [
        "006:045"
    ],
    "landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-3212",
    "title": "Data for \"Using Commercial Source Measure Units for Traceable RF Power Measurements\" for the 2024 ARFTG conference in Washington, DC.",
    "description": "As a National Metrology Institute (NMI), the National Institute of Standards and Technology (NIST) maintains traceable measurement capabilities for a variety of quantities, including microwave power. At NMIs and calibration laboratories, traceable microwave power measurements often rely on the principle of dc substitution. This approach involves a power meter that provides dc power to a sensor under test. DC substitution power meters are typically implemented by analog electronics, making them difficult to maintain. Here, we explore programmable source measure units as an alternative implementation of the power meter. We offer a preliminary uncertainty analysis and describe a method to reduce measurement uncertainty due to the accuracy of the measurement equipment. This is data for the manuscript \"Using Commercial Source Measure Units for Traceable RF Power Measurements\" for the 2024 ARFTG conference.",
    "language": [
        "en"
    ],
    "distribution": [
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3212\/residuals_data.csv",
            "format": "CSV",
            "description": "The file 'residuals_data.csv' contains data used to create Figure 3.This data contains differences in voltage and current between readings on the reference DMM and the SMU (calibrated and uncalibrated).The data shows the calibration model generally corrects readings on the SMU to behave more like the reference DMM.Data columns of the files can be interpretted as follows:  column A: untitled    Sample index of data. column B: vsmu (V)    x-axis of Figure 3 (left). Uncalibrated voltage measured by the SMU, in V.  column C: ismu (A)    x-axis of Figure 3 (right). Uncalibrated current measured by the SMU, in A. column D: residual_uncalibrated_v (uV)    Difference between uncalibrated SMU and DMM voltage readings  in uV.  column E: residual_calibrated_v (uV)    Difference between calibrated SMU and DMM voltage readings    in uV.  column F: residual_uncalibrated_i (uA)    Difference between uncalibrated SMU and DMM current readings    in uA.  column G: residual_calibrated_i (uA)    Difference between uclibrated SMU and DMM current readings    in uA.",
            "mediaType": "text\/csv",
            "title": "Residuals Data"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3212\/coefficient_history_data.csv",
            "format": "CSV",
            "description": "This data contains calibration coefficients and their uncertainties, repeated over a 2 month period. Correlationsbetween offset and slope coefficients are apparent. All uncertainties are are expressed as k=1 expanded uncertainties. Units are described in the data column formats below.Data columns are formatted as follows:  column A: untitled    Row index.  column B: dates   Dates of calibrations corresponding to rows.  columns C - R: <v0\/vm\/i0\/im>_<mu\/sd>_<singlecal\/longterm>   Replace each <bracketed> item with one of the options seperated by    a slash.    The first item selects the coefficients: v0 expressed in uV   expressed in uV, vm expressed in uV\/V, i0 expressed in mA, or   im expressed in uA.     The second item is either 'mu' for the average value, or sd for the   k = 1 expanded uncertainty.   The last item specifies the value for the longterm model or for a single    calibration at the associated date.",
            "mediaType": "text\/csv",
            "title": "Coefficient History Data"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3212\/README.txt",
            "format": "plain text",
            "description": "This file contains general information about the provenance of the data set, as well as descriptions and instructions for how to interpret the provided CSV files.",
            "mediaType": "text\/plain",
            "title": "README"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3212\/model_uncertainty_data.csv",
            "format": "CSV",
            "description": "The file 'model_uncertainty_data.csv' contains data used to create Figure 5.This data contains systematic uncertainties (k=1) in dc substituted power for a simulated measurement. Columns A-F represent uncertainty mechanisms contribut-ing to the uncertainty of Psub for the long term calibration model. Columns G-I represent total systematic uncertaintiesbetween manufacturer specified accuracy models and the long term calibrationmodel of the SMU.Data columns are formatted as follows:  column A: untitled    Row index column B:nominal_power (mW)   x-axis in figure 5. Nominal dc substituted power from which uncertainty is calculated in mW.  column C:$I_{\\mathrm{ref}}$ specified accuracy (uW)    Contribution of reference DMM current accuracy to total uncertainty in long term    calibration model, in uW. column D:Long term repeatability (uW)   Contribution of long term repeatability to total uncertainty in long term   calibration model, in uW. column E:$V_{\\mathrm{ref}}$ specified accuracy (uW)   Contribution of reference DMM voltage accuracy to total uncertainty in long term   calibration model, in uW. column F:Short term repeatability (uW)    Contribution of short term repeatability to total uncertainty in long term    calibration model, in uW. column G:Uncalibrated SMU, Perfectly Correlated (uW)    Total uncertainty of manufacturer specifications assuming perfectly correlated    accuracy models between measurements, in uW.  column H:Uncalibrated SMU, Independent (uW)   Total uncertainty of manufacturer specifications assuming independent   accuracy models between measurements, in uW.  column I:Long term calibrated SMU (uW)    Total uncertainty of long term calibration model, in uW.",
            "mediaType": "text\/csv",
            "title": "Model Uncertainty Data"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3212\/sample_run_data.csv",
            "format": "CSV",
            "description": "The file 'sample_run_data.csv' contains data used in Figure 1. This data is an example of an SMU performing a dc substitution measure-ment at 50 GHz for the 2.4 mm connector type. It contains a time series ofmeasured dc resistance of the thin film and a timeseries of applied dc power to control the resistance.The thin film inside sensor is held at 965.4 ? by the feedback loop.The dc power adjusts to maintain a constant resistance during theon\/off cycle.Data columns are as follows:  column A: untitled    Sample index of data.  column B: t_smu (s)  Relative time of time series data in seconds,    referenced to beginning of timeseries.  column C: r_smu (Ohms)    Resistance measured by the SMU in Ohms.  column D: p_smu (W)    Power measured by the SMU in Watts.The RF 'ON' line in Figure 1 occurs on sample index 13.The RF 'OFF' line in Figure 1 occurs on sample index 36.",
            "mediaType": "text\/csv",
            "title": "Sample Run Data"
        }
    ],
    "bureauCode": [
        "006:55"
    ],
    "modified": "2024-04-01 00:00:00",
    "publisher": {
        "@type": "org:Organization",
        "name": "National Institute of Standards and Technology"
    },
    "theme": [
        "Metrology:Electrical\/electromagnetic metrology"
    ],
    "keyword": [
        "power",
        "calibration services"
    ]
}