{
    "identifier": "ark:\/88434\/mds2-2269",
    "accessLevel": "public",
    "contactPoint": {
        "hasEmail": "mailto:[email protected]",
        "fn": "David R. Black"
    },
    "programCode": [
        "006:045"
    ],
    "landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-2269",
    "title": "Diffraction data for SRM 1979",
    "description": "These datasets are the high-resolution data collected at the APS 11-BM synchrotron beamline, and used to certify the microstructural characteristics of the two components (15 nm and 60 nm nominal microscrystallites) of SRM 1979. They are presented as CIF files containing the data as collected and processed by the 11BM software to make uniformly-spaced angle step data files. \u00a0Each CIF contains the 'raw' data from 11BM, the same data with an angular scale corrected by refinement of SRM660c data collected in the same run, and finally a computed data set from a Rietveld structural fit to the results. There are 9 CIF files in the ZIP archive.  Each file is names xxxx_yy_nm_zzz.cif where xxxx is the run number at APS under which the data were collected, yy is either 15 or 60 for the nominal crystallite size, and zzz is the bottle number form the random sampling of the SRM used to take this measurement.",
    "language": [
        "en"
    ],
    "distribution": [
        {
            "accessURL": "https:\/\/doi.org\/10.18434\/M32269",
            "title": "DOI Access for Diffraction data for SRM 1979"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2269\/srm_1979_cifs_20201110a.zip.sha256",
            "mediaType": "text\/plain",
            "title": "SHA256 File for Zip file containing CIF datasets for SRM 1979 from synchrotron"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2269\/srm_1979_cifs_20201110a.zip",
            "format": "ZIP file",
            "description": "Each CIF file contains the data for a specific sample, presented 3 ways. The first set is the data, as measured and converted to a continuous scan by the 11BM software.  The second set is the measured data, but with a corrected angular scale.  The third is a computed pattern from Topas, on the corrected angular scale, based on a Rietveld fit.",
            "mediaType": "application\/zip",
            "title": "Zip file containing CIF datasets for SRM 1979 from synchrotron"
        }
    ],
    "bureauCode": [
        "006:55"
    ],
    "modified": "2020-11-10 00:00:00",
    "publisher": {
        "@type": "org:Organization",
        "name": "National Institute of Standards and Technology"
    },
    "theme": [
        "Materials:Materials characterization"
    ],
    "keyword": [
        "Xray Power Diffraction; Diverging Beam Diffractometer; Power Diffraction SRM"
    ]
}