Data provided by National Institute of Standards and Technology
Dataset for multiple publishable figures in the paper entitled "Digitizer Linearity Measurement with a Josephson Arbitrary Waveform Synthesizer"in CPEM 2024 abstract
About this Dataset
Updated: 2024-09-06
Metadata Last Updated:
2024-02-01 00:00:00
Date Created:
N/A
Data Provided by:
Dataset Owner:
N/A
Title | Digitizer Linearity Measurement with a Josephson Arbitrary Waveform SynthesizerData shown in CPEM 2024 abstract |
---|---|
Description | Dataset for multiple publishable figures in the paper entitled "Digitizer Linearity Measurement with a Josephson Arbitrary Waveform Synthesizer"in CPEM 2024 abstract |
Modified | 2024-02-01 00:00:00 |
Publisher Name | National Institute of Standards and Technology |
Contact | mailto:[email protected] |
Keywords | Josephson effect , digital sampling , voltage measurement , voltage fluctuations , humidity dependence. |
{ "identifier": "ark:\/88434\/mds2-3166", "accessLevel": "public", "contactPoint": { "hasEmail": "mailto:[email protected]", "fn": "Raegan Johnson" }, "programCode": [ "006:045" ], "landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-3166", "title": "Digitizer Linearity Measurement with a Josephson Arbitrary Waveform SynthesizerData shown in CPEM 2024 abstract", "description": "Dataset for multiple publishable figures in the paper entitled \"Digitizer Linearity Measurement with a Josephson Arbitrary Waveform Synthesizer\"in CPEM 2024 abstract", "language": [ "en" ], "distribution": [ { "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3166\/3166_README.txt", "mediaType": "text\/plain", "title": "3166_README" }, { "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3166\/Medina_Fig1bottom_10mVspan.csv", "description": "Medina paper Fig1bottom_10mVspan", "mediaType": "text\/csv", "title": "Fig1 bottom_10mVspan" }, { "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3166\/Medina_Fig1top_100mVspan.csv", "description": "Medina paper Fig1top_100mVspan", "mediaType": "text\/csv", "title": "Fig1top_100mVspan" }, { "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3166\/Medina_Fig2.csv", "description": "Medina_Fig2", "mediaType": "text\/csv", "title": "Fig2 file" }, { "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3166\/Medina_Fig3a.csv", "description": "Medina_Fig3a", "mediaType": "text\/csv", "title": "Fig3a file" }, { "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3166\/Medina_Fig3b.csv", "description": "Medina_Fig3b", "mediaType": "text\/csv", "title": "Fig3b file" }, { "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3166\/Medina_Fig4.csv", "description": "Medina_Fig4", "mediaType": "text\/csv", "title": "Fig4 file" } ], "bureauCode": [ "006:55" ], "modified": "2024-02-01 00:00:00", "publisher": { "@type": "org:Organization", "name": "National Institute of Standards and Technology" }, "theme": [ "Metrology:Electrical\/electromagnetic metrology", "Electronics:Superconducting electronicsMetrology" ], "keyword": [ "Josephson effect", "digital sampling", "voltage measurement", "voltage fluctuations", "humidity dependence." ] }