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InGaAs Trap Detector: Advancing Toward a Short-Wave Infrared Standard with 1% Uncertainty

Data provided by  National Institute of Standards and Technology

No additional requirements: Working data, derived data (OISM-provided Level 1 storage) Individual user responsibility: Publishable results, Published results (OISM-provided, Level 2 storage) Not available to the public: Working data, derived data (experimental raw data), and publishable results. Made available to the public as described below: Published results that appear in publicly accessible reports, such as in journals and conference proceedings.

About this Dataset

Updated: 2025-11-16
Metadata Last Updated: 2025-01-02 00:00:00
Date Created: N/A
Data Provided by:
Dataset Owner: N/A

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Table representation of structured data
Title InGaAs Trap Detector: Advancing Toward a Short-Wave Infrared Standard with 1% Uncertainty
Description No additional requirements: Working data, derived data (OISM-provided Level 1 storage) Individual user responsibility: Publishable results, Published results (OISM-provided, Level 2 storage) Not available to the public: Working data, derived data (experimental raw data), and publishable results. Made available to the public as described below: Published results that appear in publicly accessible reports, such as in journals and conference proceedings.
Modified 2025-01-02 00:00:00
Publisher Name National Institute of Standards and Technology
Contact mailto:[email protected]
Keywords Trap detector , Calibration , metrology , InGaAs photodiode. 
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    "title": "InGaAs Trap Detector: Advancing Toward a Short-Wave Infrared Standard with 1% Uncertainty",
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    "modified": "2025-01-02 00:00:00",
    "publisher": {
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    "theme": [
        "Metrology:Optical, photometry, and laser metrology"
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