{
    "identifier": "ark:\/88434\/mds2-3555",
    "accessLevel": "public",
    "contactPoint": {
        "hasEmail": "mailto:[email protected]",
        "fn": "Lucas Enright"
    },
    "programCode": [
        "006:045"
    ],
    "landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-3555",
    "title": "Interlaboratory comparison of cavity resonator measurements for complex permittivity to 170 GHz",
    "description": "Figure data for \"Interlaboratory comparison of cavity resonator measurements for complex permittivity to 170 GHz\"ABSTRACT:Standards provide known right answers traceable to National Metrology Institutes. Today, no such complex permittivity standard exists, let alone one traceable to the International System of Units (SI). In response, a consortium of industrial, academic, and government laboratories - led by the International Electronics Manufacturing Initiative (iNEMI) - performed an interlaboratory comparison to understand the impact of this problem and how a new standard could help. The goal of the comparison was to benchmark the best-case interlaboratory agreement in complex permittivity measurements up to 170 GHz and provide some industry-led guidance for making the standard useful. The consortium used four different types of commercial resonators from 10 GHz to 170 GHz. Here, we show how we improved the best-case repeatability and interlaboratory agreement of these resonator measurements. We leverage the broader capabilities of nine industry (e.g., Intel, Panasonic, 3M) and government (e.g., NIST, ITRI) labs worldwide in the four interlaboratory comparisons presented here. These interlaboratory comparisons quantify interlaboratory agreement and incorporate stakeholder feedback to develop a fit-for-purpose standard for complex permittivity.",
    "language": [
        "en"
    ],
    "distribution": [
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3555\/Figure9DataAgg.csv",
            "mediaType": "text\/csv",
            "title": "Figure9DataAgg"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3555\/Figure6DataAgg.csv",
            "mediaType": "text\/csv",
            "title": "Figure6DataAgg"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3555\/Figure7DataAgg.csv",
            "mediaType": "text\/csv",
            "title": "Figure7DataAgg"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3555\/Figure5DataAgg.csv",
            "mediaType": "text\/csv",
            "title": "Figure5DataAgg"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3555\/Figure8DataAgg.csv",
            "mediaType": "text\/csv",
            "title": "Figure8DataAgg"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3555\/Figure10DataAgg.csv",
            "mediaType": "text\/csv",
            "title": "Figure10DataAgg"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3555\/README.txt",
            "mediaType": "text\/plain",
            "title": "README"
        }
    ],
    "bureauCode": [
        "006:55"
    ],
    "modified": "2024-09-11 00:00:00",
    "publisher": {
        "@type": "org:Organization",
        "name": "National Institute of Standards and Technology"
    },
    "theme": [
        "Materials:Polymers",
        "Materials:Ceramics",
        "Materials:Materials characterization",
        "Metrology:Electrical\/electromagnetic metrology"
    ],
    "keyword": [
        "dielectrics",
        "permittivity",
        "interlaboratory comparison"
    ]
}