{
    "identifier": "ark:\/88434\/mds2-4138",
    "accessLevel": "public",
    "contactPoint": {
        "hasEmail": "mailto:[email protected]",
        "fn": "Alain Rufenacht"
    },
    "programCode": [
        "006:045"
    ],
    "landingPage": "",
    "title": "Leakage Current Effects with Programmable Josephson Voltage Standards",
    "description": "This work presents the results of evaluating and measuring the dc leakage effects associated with Programmable Josephson Voltage Standards (PJVS). Two types of leakage error can occur in PJVS systems. The first type involves leakage currents to Earth ground, which can result from the resistance of cable insulation and the bias electronics. The second type is related to the voltage divider effect, caused by potential leakage paths on the precision output leads. Both effects can impact the measurement accuracy of the PJVS and must be monitored regularly. We have developed assessment methods, including both manual and automated measurements, that can be applied to any disseminated PJVS systems currently in use.",
    "language": [
        "en"
    ],
    "distribution": [
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-4138\/Fig%204%20Leakage%20current%20vs%20voltage.csv",
            "description": "Measured leakage current as a function of the PJVS voltage obtained with the automated LCG module of the Programmable Josephson Voltage Standard",
            "mediaType": "text\/csv",
            "title": "Leakage current vs voltage"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-4138\/Fig%205%20LRG%20vs%20RH.csv",
            "description": "Measurement of the LRG of a cryocooled PJVS system and its correlation with relative humidity",
            "mediaType": "text\/csv",
            "title": "LRG vs RH"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-4138\/Fig%202%20Raw%20DVM%20data.csv",
            "description": "Raw voltmeter readings of the voltage across the leakage sense resistor (10 kohm) for both bias polarities",
            "mediaType": "text\/csv",
            "title": "Raw DVM measurement"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-4138\/Fig%208%20LRO%20measurement.csv",
            "description": "Measured leakage resistance of the output leads with the LRO module and the room relative humidity",
            "mediaType": "text\/csv",
            "title": "LRO measurement"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-4138\/Fig%209%20LRO%20measurement%20with%20100%20Gohm%20test%20resistance.csv",
            "description": "Measured leakage resistance of the output leads with the LRO module, obtained with a 100 Gohm test resistance added in parallel and the room relative humidity",
            "mediaType": "text\/csv",
            "title": "LRO measurement with 100 Gohm test resistance"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-4138\/4138_README.txt",
            "description": "Read me file with an explanation of the data collected",
            "mediaType": "text\/plain",
            "title": "Read Me File"
        }
    ],
    "bureauCode": [
        "006:55"
    ],
    "modified": "2025-11-30 00:00:00",
    "publisher": {
        "@type": "org:Organization",
        "name": "National Institute of Standards and Technology"
    },
    "theme": [
        "Metrology:Electrical\/electromagnetic metrology"
    ],
    "keyword": [
        "Josephson junctions",
        "Leakage currents",
        "Measurement uncertainty",
        "Standards",
        "Superconducting integrated circuits",
        "Voltage measurement"
    ]
}