{
    "identifier": "ark:\/88434\/mds2-3146",
    "accessLevel": "public",
    "contactPoint": {
        "hasEmail": "mailto:[email protected]",
        "fn": "Raegan Johnson"
    },
    "programCode": [
        "006:045"
    ],
    "landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-3146",
    "title": "Leakage Current Pathways in Josephson Arbitrary Waveform Synthesizer StandardsData shown in CPEM 2024 abstract",
    "description": "Dataset for multiple publishable figures in the paper entitled \"Leakage Current Pathways in Josephson Arbitrary Waveform Synthesizer Standards\"to be submitted to CPEM 2024The voltage errors associated with leakage currents in Josephson arbitrary waveform synthesizer (JAWS) systems are significant contributors to the overall system accuracy. This paper describes discrepancies in output voltage between two different circuit halves on a single JAWS chip and shows that this discrepancy is dominated by ac leakage currents through the stray capacitance in the compensation leads.",
    "language": [
        "en"
    ],
    "distribution": [
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3146\/3146_README.txt",
            "description": "Readme file that is associated with the dataset found in the csv files",
            "mediaType": "text\/plain",
            "title": "Readme file"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3146\/Fig1b.csv",
            "description": "File containing the dataset for Fig 1b",
            "mediaType": "text\/csv",
            "title": "Fig1b csv file"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3146\/Fig3.csv",
            "description": "File containing dataset for Fig 3",
            "mediaType": "text\/csv",
            "title": "Fig3"
        }
    ],
    "bureauCode": [
        "006:55"
    ],
    "modified": "2024-01-19 00:00:00",
    "publisher": {
        "@type": "org:Organization",
        "name": "National Institute of Standards and Technology"
    },
    "theme": [
        "Electronics:Superconducting electronics"
    ],
    "keyword": [
        "Leakage currents",
        "Measurement uncertainty",
        "Josephson junctions",
        "Standards",
        "Superconducting integrated circuits",
        "Voltage measurement."
    ]
}