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MAUD-Tutorial Files for "MAUD Rietveld Refinement Software for Neutron Diffraction Texture Studies of Single and Dual-Phase Materials"

This data set contains files included in the detailed instructional demonstration paper submitted to Integrating Materials and Manufacturing Innovation. The detailed instructional demonstration paper includes documentation detailing how to configure and carry out a repeatable Rietveld Refinement with the software MAUD. The data set provides: diffraction data from two different neutron diffraction measurements, crystallographic information files, and configuration files for the refinement process. The authors provide this data set to enable new users of MAUD a better user experience, and provide a series of training opportunities to ensure users of MAUD understand how the software operates beyond treating it as a black box.

About this Dataset

Updated: 2024-02-22
Metadata Last Updated: 2021-05-11 00:00:00
Date Created: N/A
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Data Provided by:
additive manufacturing
Dataset Owner: N/A

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Table representation of structured data
Title MAUD-Tutorial Files for "MAUD Rietveld Refinement Software for Neutron Diffraction Texture Studies of Single and Dual-Phase Materials"
Description This data set contains files included in the detailed instructional demonstration paper submitted to Integrating Materials and Manufacturing Innovation. The detailed instructional demonstration paper includes documentation detailing how to configure and carry out a repeatable Rietveld Refinement with the software MAUD. The data set provides: diffraction data from two different neutron diffraction measurements, crystallographic information files, and configuration files for the refinement process. The authors provide this data set to enable new users of MAUD a better user experience, and provide a series of training opportunities to ensure users of MAUD understand how the software operates beyond treating it as a black box.
Modified 2021-05-11 00:00:00
Publisher Name National Institute of Standards and Technology
Contact mailto:[email protected]
Keywords additive manufacturing , rietveld refinement , Titanium alloys , neutron diffraction
{
    "identifier": "ark:\/88434\/mds2-2400",
    "accessLevel": "public",
    "references": [
        "https:\/\/doi.org\/10.1007\/s40192-021-00224-5",
        "https:\/\/doi.org\/10.1016\/j.addma.2021.102118"
    ],
    "contactPoint": {
        "hasEmail": "mailto:[email protected]",
        "fn": "Adam Creuziger"
    },
    "programCode": [
        "006:045"
    ],
    "@type": "dcat:Dataset",
    "landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-2400",
    "description": "This data set contains files included in the detailed instructional demonstration paper submitted to Integrating Materials and Manufacturing Innovation. The detailed instructional demonstration paper includes documentation detailing how to configure and carry out a repeatable Rietveld Refinement with the software MAUD. The data set provides: diffraction data from two different neutron diffraction measurements, crystallographic information files, and configuration files for the refinement process. The authors provide this data set to enable new users of MAUD a better user experience, and provide a series of training opportunities to ensure users of MAUD understand how the software operates beyond treating it as a black box.",
    "language": [
        "en"
    ],
    "title": "MAUD-Tutorial Files for \"MAUD Rietveld Refinement Software for Neutron Diffraction Texture Studies of Single and Dual-Phase Materials\"",
    "distribution": [
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2400\/ReadMe.txt.sha256",
            "mediaType": "text\/plain",
            "title": "SHA256 File for ReadMe.txt"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2400\/ReadMe.txt",
            "format": "Text file",
            "description": "Overview of the dataset",
            "mediaType": "text\/plain",
            "title": "ReadMe.txt"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2400\/LICENSE.txt.sha256",
            "mediaType": "text\/plain",
            "title": "SHA256 File for License.txt"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2400\/LICENSE.txt",
            "format": "text",
            "description": "License for the data set",
            "mediaType": "text\/plain",
            "title": "License.txt"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2400\/hippo_sc_151003_45panels.prm.sha256",
            "mediaType": "text\/plain",
            "title": "SHA256 File for hippo_sc_151003_45panels.prm"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2400\/hippo_sc_151003_45panels.prm",
            "format": "These files use the Instrument Parameter File format described in the GSAS Technical Manual [4].",
            "description": "Information file specifying the detectors panel used in data acquisition. These files use the Instrument Parameter File format described in the GSAS Technical Manual [4].",
            "mediaType": "application\/octet-stream",
            "title": "hippo_sc_151003_45panels.prm"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/54662.gda",
            "mediaType": "application\/octet-stream"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/54662.gda.sha256",
            "mediaType": "text\/plain"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/54663.gda",
            "mediaType": "application\/octet-stream"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/54663.gda.sha256",
            "mediaType": "text\/plain"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/54664.gda",
            "mediaType": "application\/octet-stream"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/54664.gda.sha256",
            "mediaType": "text\/plain"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/57550.gda",
            "mediaType": "application\/octet-stream"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/57550.gda.sha256",
            "mediaType": "text\/plain"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/57551.gda",
            "mediaType": "application\/octet-stream"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/57551.gda.sha256",
            "mediaType": "text\/plain"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/57552.gda",
            "mediaType": "application\/octet-stream"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/57552.gda.sha256",
            "mediaType": "text\/plain"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/Ti_alpha_43416.cif.sha256",
            "mediaType": "text\/plain"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/Ti_beta_151409.cif.sha256",
            "mediaType": "text\/plain"
        },
        {
            "accessURL": "https:\/\/doi.org\/10.18434\/mds2-2400",
            "title": "DOI Access for MAUD-Tutorial Files for \"MAUD Rietveld Refinement Software for Neutron Diffraction Texture Studies of Single and Dual-Phase Materials\""
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/Ti_alpha_43416.cif",
            "mediaType": "text\/plain"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/ark:\/88434\/mds2-2400\/Ti_beta_151409.cif",
            "mediaType": "text\/plain"
        }
    ],
    "license": "https:\/\/www.nist.gov\/open\/license",
    "bureauCode": [
        "006:55"
    ],
    "modified": "2021-05-11 00:00:00",
    "publisher": {
        "@type": "org:Organization",
        "name": "National Institute of Standards and Technology"
    },
    "theme": [
        "Mathematics and Statistics:Numerical methods and software",
        "Materials:Metals",
        "Neutron Research"
    ],
    "issued": "2021-05-14",
    "keyword": [
        "additive manufacturing",
        "rietveld refinement",
        "Titanium alloys",
        "neutron diffraction"
    ]
}

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