{
    "identifier": "ark:\/88434\/mds2-3155",
    "accessLevel": "public",
    "contactPoint": {
        "hasEmail": "mailto:[email protected]",
        "fn": "Jeremy Thomas"
    },
    "programCode": [
        "006:045"
    ],
    "landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-3155",
    "title": "Measuring VHF Detector Linearity using a Quantum-Based Source, CPEM 2024",
    "description": "Data sets for measuring VHF detector linearity using a Josephson Arbitrary Waveform Synthesizer (JAWS). Two instruments are measured: an RF power sensor and a fast ADC. The VHF-JAWS source consists of a chip with 12,810~Josephson junctions located in a cryocooler and driven to produce quantum-based ac waveforms at frequencies up to 50.05~MHz and power up to -19~dBm. We first confirm that the device is operating correctly by measuring the dc offset quantum-locking range (Fig. 2) and then measure the system output power with an RF power sensor (Fig. 3, bottom) and a high-speed digitizer (Fig. 3, top). After removing an overall scale factor, the ten-nanowatt scale differences between the programmed JAWS values and the measured values (Fig. 3, top and bottom) indicate better than $\\pm$0.5~$\\%$ DUT linearity for frequencies in the VHF band.",
    "language": [
        "en"
    ],
    "distribution": [
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3155\/Readme.txt",
            "description": "Readme for the navigation, organization, and content for the data in the figures included in the Measuring VHF Detector Linearity using a Quantum-Based Source CPEM 2024 abstract.",
            "mediaType": "text\/plain",
            "title": "Readme.txt"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3155\/figure2_dc_qlr.csv",
            "description": "DC offset quantum locking ranges (QLRs) measured by the digitizer for frequencies up to 50.05 MHz and an expected output rms voltage of 25 mV. (top figure) RMS voltage magnitude (mV) vs. dc offset (mA) and (bottom figure) total harmonic distortion (THD) vs. dc offset (mA) collected by the digitizer for 50 kHz, 100 kHz, 1.5 MHz, 5.5 MHz, 15 MHz, 30 MHz, 40 MHz, and 50.05 MHz waveforms. In the figure, voltage measurements for the 30 MHz tone are offset by +6.5 mV for visual clarity. This offset is included in the dc_qlr_vrms column in this file.",
            "mediaType": "text\/csv",
            "title": "figure2_dc_qlr.csv"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3155\/figure3_bottom_residuals_power_sensor.csv",
            "description": "Power sensor linearity measured using the VHF-JAWS source for frequencies up to 50.05 MHz. Power sensor residuals (nW), i.e., differences from a linear (mx+b) fit, and standard uncertainties (nW) vs. Expected Power (uW) for 1.5 MHz, 5.5 MHz, 15 MHz, 30 MHz, 40 MHz, and 50.05 MHz. Each power sensor residual value is derived from averaging over a set of 12 measurements within a mini-QLR. The uncertainties are the standard deviation of each measurement set.",
            "mediaType": "text\/csv",
            "title": "figure3_bottom_residuals_power_sensor.csv"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3155\/figure3_top_residuals_digitizer.csv",
            "description": "Digitizer linearity measured using the VHF-JAWS source for frequencies up to 50.05 MHz. Digitizer residuals (nW), i.e., differences from a linear (mx+b) fit, and standard uncertainties (nW) vs. Expected Power (uW) for 50 kHz, 100 kHz, 1.5 MHz, 5.5 MHz, 15 MHz, 30 MHz, 40 MHz, and 50.05 MHz. Each digitizer residual value is derived from averaging over a set of 12 measurements within a mini-QLR. The uncertainties are the standard deviation of each measurement set.",
            "mediaType": "text\/csv",
            "title": "figure3_top_residuals_digitizer.csv"
        }
    ],
    "bureauCode": [
        "006:55"
    ],
    "modified": "2024-01-30 00:00:00",
    "publisher": {
        "@type": "org:Organization",
        "name": "National Institute of Standards and Technology"
    },
    "theme": [
        "Electronics:Superconducting electronics",
        "Metrology:Electrical\/electromagnetic metrology"
    ],
    "keyword": [
        "Josephson junction arrays",
        "power measurement standards",
        "digital-analog conversion",
        "signal synthesis",
        "superconducting integrated circuits",
        "superconducting microwave devices"
    ]
}