{
    "identifier": "ECBCC1C1300A2ED9E04306570681B10716",
    "accessLevel": "public",
    "references": [
        "https:\/\/www.nist.gov\/document\/sessa211usersguideaug2018pdf",
        "https:\/\/dx.doi.org\/10.1002\/sia.2097"
    ],
    "contactPoint": {
        "hasEmail": "mailto:[email protected]",
        "@type": "vcard:Contact",
        "fn": "Cedric J. Powell"
    },
    "programCode": [
        "006:052"
    ],
    "@type": "dcat:Dataset",
    "landingPage": "https:\/\/www.nist.gov\/srd\/nist-standard-reference-database-100",
    "description": "The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as islands, lines, spheres, and layered spheres on surfaces. As for earlier versions, such simulations can be performed for multilayer films. Users can specify the compositions and dimensions of each material in the sample structure as well as the measurement configuration. The database contains extensive physical data needed for quantitative interpretations of observed spectra. A more detailed description of SESSA has been published [W. Smekal, W. S. M. Werner, and C. J. Powell Surf. Interface Anal. 37, 1059 (2005)].",
    "language": [
        "en"
    ],
    "title": "NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) - SRD 100",
    "distribution": [
        {
            "accessURL": "https:\/\/dx.doi.org\/10.18434\/T4C30S",
            "format": "text\/html",
            "description": "DOI Access to NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) - SRD 100",
            "mediaType": "text\/html",
            "title": "DOI Access to NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) - SRD 100"
        }
    ],
    "license": "https:\/\/www.nist.gov\/open\/license",
    "bureauCode": [
        "006:55"
    ],
    "modified": "2014-11-01 00:00:00",
    "publisher": {
        "@type": "org:Organization",
        "name": "National Institute of Standards and Technology"
    },
    "accrualPeriodicity": "irregular",
    "theme": [
        "Standards:Reference data"
    ],
    "keyword": [
        "Auger electron spectroscopy",
        "Auger-electron",
        "Auger-electron backscattering factors",
        "XPS",
        "cross sections",
        "elastic scattering",
        "electron scattering",
        "electron transport",
        "electron-impact ionization cross section",
        "fluorescence yields",
        "inelastic mean free paths",
        "inelastic scattering",
        "photoelectron lineshapes",
        "photoionization asymmetry parameters",
        "photoionization cross sections",
        "surface analysis",
        "transport cross sections",
        "x-ray photoelectron spectroscopy"
    ]
}