{
    "identifier": "ark:\/88434\/mds2-3197",
    "accessLevel": "public",
    "contactPoint": {
        "hasEmail": "mailto:[email protected]",
        "fn": "June W. Lau"
    },
    "programCode": [
        "006:045"
    ],
    "landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-3197",
    "title": "NLP-Driven Microscopy Ontology Development - Raw data DOIs",
    "description": "This dataset contains the DOIs of the corpus, used for the natural language processing analysis described in the article of the same title. The DOIs all point to articles published in the Microscopy and Microanalysis conference proceeding, spanning 2002 through 2019.",
    "language": [
        "en"
    ],
    "distribution": [
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3197\/DOI_data.zip",
            "mediaType": "application\/zip",
            "title": "DOI_data"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3197\/no-resolve.txt",
            "mediaType": "text\/plain",
            "title": "no-resolve"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3197\/3197_README.txt",
            "mediaType": "text\/plain",
            "title": "3197_README"
        }
    ],
    "bureauCode": [
        "006:55"
    ],
    "modified": "2024-03-18 00:00:00",
    "publisher": {
        "@type": "org:Organization",
        "name": "National Institute of Standards and Technology"
    },
    "theme": [
        "Materials:Modeling and computational material science",
        "Materials:Materials characterization",
        "Information Technology:Data and informatics"
    ],
    "keyword": [
        "NLP corpus",
        "electron microscopy keywords",
        "controlled vocabulary",
        "ontology"
    ]
}