Data from figure 4 "Measuring photonic optomechanical devices" in manuscript "Integrated photonic optomechanical atomic force microscopy probes batch fabricated using deep UV photolithography," in Journal of Microelectromechanical Systems, doi: 10.1109/JMEMS.2023.3247300.
About this Dataset
Title | Data for manuscript: Integrated photonic optomechanical atomic force microscopy probes batch fabricated using deep UV photolithography |
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Description | Data from figure 4 "Measuring photonic optomechanical devices" in manuscript "Integrated photonic optomechanical atomic force microscopy probes batch fabricated using deep UV photolithography," in Journal of Microelectromechanical Systems, doi: 10.1109/JMEMS.2023.3247300. |
Modified | 2022-10-10 00:00:00 |
Publisher Name | National Institute of Standards and Technology |
Contact | mailto:[email protected] |
Keywords | integrated photonics , cavity optomechanical sensors |
{ "identifier": "ark:\/88434\/mds2-2815", "accessLevel": "public", "contactPoint": { "hasEmail": "mailto:[email protected]", "fn": "Vladimir Aksyuk" }, "programCode": [ "006:045" ], "landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-2815", "title": "Data for manuscript: Integrated photonic optomechanical atomic force microscopy probes batch fabricated using deep UV photolithography", "description": "Data from figure 4 \"Measuring photonic optomechanical devices\" in manuscript \"Integrated photonic optomechanical atomic force microscopy probes batch fabricated using deep UV photolithography,\"\u00a0in\u00a0Journal of Microelectromechanical Systems, doi: 10.1109\/JMEMS.2023.3247300.", "language": [ "en" ], "distribution": [ { "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2815\/Fig4b_experimental_data.csv", "description": "Broad wavelength scan for transverse magnetic (TM) polarized modes of a typical disk-cantilever device (w = 150 nm, G = 180 nm )", "mediaType": "text\/csv", "title": "Experimental data for figure 4(b)" }, { "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2815\/Fig4c_experimental_data.csv", "description": "High-Q optical resonance indicated with an red arrow in (b)", "mediaType": "text\/csv", "title": "Experimental data for Figure 4c" }, { "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2815\/Fig4c_fit_data.csv", "description": "Lorentzian fit Q=64000", "mediaType": "text\/csv", "title": "Fit data for Figure 4c" }, { "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2815\/Fig4d_experimental_data_10um.csv", "description": "Transducer non-contact noise spectral density S_d for two devices with different dimensions. Device with a 10 micrometer disk (upper, red) presents a lowest in-plane mode eigenfrequency of ?_0\/2? ? 5 MHz and damping coefficient ?\/2? ? 0.34 MHz while the 5 micrometer disk device (lower, blue) presents ?_0\/2? ? 25 MHz and damping coefficient ?\/2? ? 0.28 MHz.", "mediaType": "text\/csv", "title": "Experimental data for figure 4d, 10 micrometer disk." }, { "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2815\/Fig4d_experimental_data_5um.csv", "description": "Transducer non-contact noise spectral density S_d for two devices with different dimensions. Device with a 10 micrometer disk (upper, red) presents a lowest in-plane mode eigenfrequency of ?_0\/2? ? 5 MHz and damping coefficient ?\/2? ? 0.34 MHz while the 5 micrometer disk device (lower, blue) presents ?_0\/2? ? 25 MHz and damping coefficient ?\/2? ? 0.28 MHz.", "mediaType": "text\/csv", "title": "Experimental data for Figure 4d, 5 micrometer disk" } ], "bureauCode": [ "006:55" ], "modified": "2022-10-10 00:00:00", "publisher": { "@type": "org:Organization", "name": "National Institute of Standards and Technology" }, "theme": [ "Nanotechnology:Nanofabrication\/manufacturing", "Nanotechnology:Nanomechanics", "Nanotechnology:Nanophotonics" ], "keyword": [ "integrated photonics", "cavity optomechanical sensors" ] }