This comprehensive data set includes the electrical characterization measurements of sputtered Nb/a-Si/Nb Josephson junctions (JJs) for high-speed and high-density superconducting electronics. JJs were studied with critical current densities (Jc) ranging from 0.01 mA/?m^2 to 3 mA/?m^2 and with and without annealing at various temperatures. These properties indicate that Nb/a-Si/Nb Josephson junctions are a potential candidate to extend the speed and circuit density of superconducting electronics to 50 nm diameter (25 mA/?m^2) JJs.
About this Dataset
Title | Nb/a-Si/Nb Josephson junctions for high-density superconducting circuits |
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Description | This comprehensive data set includes the electrical characterization measurements of sputtered Nb/a-Si/Nb Josephson junctions (JJs) for high-speed and high-density superconducting electronics. JJs were studied with critical current densities (Jc) ranging from 0.01 mA/?m^2 to 3 mA/?m^2 and with and without annealing at various temperatures. These properties indicate that Nb/a-Si/Nb Josephson junctions are a potential candidate to extend the speed and circuit density of superconducting electronics to 50 nm diameter (25 mA/?m^2) JJs. |
Modified | 2023-02-08 00:00:00 |
Publisher Name | National Institute of Standards and Technology |
Contact | mailto:[email protected] |
Keywords | Josephson junctions , superconducting electronics , Josephson devices , single flux quantum , fabrication process |
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