The data used to generate the graphs in figures 2, 4, 5 and 6 of the paper "Evaluating Uncertainty of Nonlinear Microwave Calibrations from Regression Residuals". The full reference is D. F. Williams, B. Jamroz and J. D. Rezac, "Evaluating Uncertainty of Nonlinear Microwave Calibration Models With Regression Residuals," in IEEE Transactions on Microwave Theory and Techniques, vol. 68, no. 9, pp. 3776-3782, Sept. 2020, doi: 10.1109/TMTT.2020.3005170. 0. The file with data for Fig. X is named FigX.zip. 1. The file Fig X guide.txt in the top directory of each zip file describes which EasyPlot file was used to create the graph(s) in the figure. 2. The EasyPlot files were made with EasyPlot V 4.0.4, and document the data locations, legends, etc. EasyPlot column-selection format is as follows: "xyiiyy" or "xy..yy" means that column 1 was used for x axis, column 2 for first curve y values, column 5 for second curve y values, column 6 for third curve y values
About this Dataset
Title | Evaluating Uncertainty of Nonlinear Microwave Calibration Models from Regression Residuals |
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Description | The data used to generate the graphs in figures 2, 4, 5 and 6 of the paper "Evaluating Uncertainty of Nonlinear Microwave Calibrations from Regression Residuals". The full reference is D. F. Williams, B. Jamroz and J. D. Rezac, "Evaluating Uncertainty of Nonlinear Microwave Calibration Models With Regression Residuals," in IEEE Transactions on Microwave Theory and Techniques, vol. 68, no. 9, pp. 3776-3782, Sept. 2020, doi: 10.1109/TMTT.2020.3005170. 0. The file with data for Fig. X is named FigX.zip. 1. The file Fig X guide.txt in the top directory of each zip file describes which EasyPlot file was used to create the graph(s) in the figure. 2. The EasyPlot files were made with EasyPlot V 4.0.4, and document the data locations, legends, etc. EasyPlot column-selection format is as follows: "xyiiyy" or "xy..yy" means that column 1 was used for x axis, column 2 for first curve y values, column 5 for second curve y values, column 6 for third curve y values |
Modified | 2020-01-23 00:00:00 |
Publisher Name | National Institute of Standards and Technology |
Contact | mailto:[email protected] |
Keywords | Confidence intervals , coupling corrections , on-wafer measurement , prediction intervals. |
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