Data provided by National Institute of Standards and Technology
The enclosed dataset includes measurements of a thickness series of CoFeB thin film samples that were deposited at the NIST Magnetic Engineering Research Facility using magnetron sputtering. The thickness-dependent magnetic properties of CoFeB have significant technological relevance for predicting the read/write energy and speed of spin-transfer-torque magnetoresistive random access memory devices, which employ a nm-thick CoFeB film as the data storage layer. Ferromagnetic resonance observations were conducted using vector network analyzer ferromagnetic resonance at fixed frequencies over a broad frequency range. The ferromagnetic resonance field and resonance linewidth versus frequency were used to determine the spectroscopic g-factor, effective magnetization Meff, Gilbert damping and the inhomogeneous linewidth broadening, respectively. This is a preliminary release and additional data will be added as this project continues
About this Dataset
Updated: 2025-04-06
Metadata Last Updated:
2024-07-12 00:00:00
Date Created:
N/A
Data Provided by:
Dataset Owner:
N/A
| Title | Evaluation of static and dynamic magnetic properties of CoFeB versus thickness |
|---|---|
| Description | The enclosed dataset includes measurements of a thickness series of CoFeB thin film samples that were deposited at the NIST Magnetic Engineering Research Facility using magnetron sputtering. The thickness-dependent magnetic properties of CoFeB have significant technological relevance for predicting the read/write energy and speed of spin-transfer-torque magnetoresistive random access memory devices, which employ a nm-thick CoFeB film as the data storage layer. Ferromagnetic resonance observations were conducted using vector network analyzer ferromagnetic resonance at fixed frequencies over a broad frequency range. The ferromagnetic resonance field and resonance linewidth versus frequency were used to determine the spectroscopic g-factor, effective magnetization Meff, Gilbert damping and the inhomogeneous linewidth broadening, respectively. This is a preliminary release and additional data will be added as this project continues |
| Modified | 2024-07-12 00:00:00 |
| Publisher Name | National Institute of Standards and Technology |
| Contact | mailto:[email protected] |
| Keywords | ferromagnetic resonance , MRAM , magnetism , ferromagnetism , thin film |
{
"identifier": "ark:\/88434\/mds2-3408",
"accessLevel": "public",
"contactPoint": {
"hasEmail": "mailto:[email protected]",
"fn": "Hans Nembach"
},
"programCode": [
"006:045"
],
"landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-3408",
"title": "Evaluation of static and dynamic magnetic properties of CoFeB versus thickness",
"description": "The enclosed dataset includes measurements of a thickness series of CoFeB thin film samples that were deposited at the NIST Magnetic Engineering Research Facility using magnetron sputtering. The thickness-dependent magnetic properties of CoFeB have significant technological relevance for predicting the read\/write energy and speed of spin-transfer-torque magnetoresistive random access memory devices, which employ a nm-thick CoFeB film as the data storage layer. Ferromagnetic resonance observations were conducted using vector network analyzer ferromagnetic resonance at fixed frequencies over a broad frequency range. The ferromagnetic resonance field and resonance linewidth versus frequency were used to determine the spectroscopic g-factor, effective magnetization Meff, Gilbert damping and the inhomogeneous linewidth broadening, respectively. This is a preliminary release and additional data will be added as this project continues",
"language": [
"en"
],
"distribution": [
{
"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3408\/3408_README.txt",
"mediaType": "text\/plain",
"title": "3408_README"
},
{
"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3408\/FMR%20Measurements%2FFMR%20fit%20functions.pdf",
"mediaType": "application\/pdf",
"title": "FMR Measurements\/FMR fit functions"
},
{
"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3408\/FMR%20Measurements%2FHeader%20for%20Data.pdf",
"mediaType": "application\/pdf",
"title": "FMR Measurements\/Header for Data"
},
{
"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3408\/FMR%20Measurements%2FHeader%20for%20fit%20results.pdf",
"mediaType": "application\/pdf",
"title": "FMR Measurements\/Header for fit results"
},
{
"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3408\/FMR%20Measurements%2FOut-of-plane%2F20240410A_OPP.zip",
"mediaType": "application\/zip",
"title": "FMR Measurements\/Out-of-plane\/20240410A_OPP"
},
{
"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3408\/FMR%20Measurements%2FOut-of-plane%2F20240410C_OPP.zip",
"mediaType": "application\/zip",
"title": "FMR Measurements\/Out-of-plane\/20240410C_OPP"
},
{
"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3408\/FMR%20Measurements%2FOut-of-plane%2F20240410D_OPP.zip",
"mediaType": "application\/zip",
"title": "FMR Measurements\/Out-of-plane\/20240410D_OPP"
},
{
"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3408\/FMR%20Measurements%2FOut-of-plane%2F20240411C_OPP.zip",
"mediaType": "application\/zip",
"title": "FMR Measurements\/Out-of-plane\/20240411C_OPP"
},
{
"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3408\/FMR%20Measurements%2FOut-of-plane%2F20240412B_OPP.zip",
"mediaType": "application\/zip",
"title": "FMR Measurements\/Out-of-plane\/20240412B_OPP"
},
{
"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-3408\/FMR%20Measurements%2FOut-of-plane%2F20240415B_OPP.zip",
"mediaType": "application\/zip",
"title": "FMR Measurements\/Out-of-plane\/20240415B_OPP"
}
],
"bureauCode": [
"006:55"
],
"modified": "2024-07-12 00:00:00",
"publisher": {
"@type": "org:Organization",
"name": "National Institute of Standards and Technology"
},
"theme": [
"Physics:MagneticsNanotechnology"
],
"keyword": [
"ferromagnetic resonance",
"MRAM",
"magnetism",
"ferromagnetism",
"thin film"
]
}
