{
    "identifier": "ark:\/88434\/mds2-2251",
    "accessLevel": "public",
    "contactPoint": {
        "hasEmail": "mailto:[email protected]",
        "fn": "David R. Black"
    },
    "programCode": [
        "006:045"
    ],
    "landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-2251",
    "title": "Diffraction Data for SRM 640f",
    "description": "The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle.  Almost all of it is collected using a position-sensitive detector (PSD), and is stored in CIF format.",
    "language": [
        "en"
    ],
    "distribution": [
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2251\/srm640f_cifs_20200601a.zip.sha256",
            "mediaType": "text\/plain",
            "title": "SHA256 File for Diffraction Data for SRM 640f"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2251\/srm640f_cifs_20200601a.zip",
            "description": "X-ray diffraction data expressed as intensity as a function of angle",
            "mediaType": "application\/x-zip-compressed",
            "title": "Diffraction Data for SRM 640f"
        },
        {
            "accessURL": "https:\/\/doi.org\/10.18434\/M32251",
            "title": "DOI Access for Diffraction Data for SRM 640f"
        }
    ],
    "bureauCode": [
        "006:55"
    ],
    "modified": "2020-06-01 00:00:00",
    "publisher": {
        "@type": "org:Organization",
        "name": "National Institute of Standards and Technology"
    },
    "theme": [
        "Materials:Materials characterization"
    ],
    "keyword": [
        "Xray Powder Diffraction; Diverging Beam Diffractometer; Powder Diffraction SRM"
    ]
}