{
    "identifier": "ark:\/88434\/mds2-4087",
    "accessLevel": "public",
    "contactPoint": {
        "hasEmail": "mailto:[email protected]",
        "fn": "Alain Rufenacht"
    },
    "programCode": [
        "006:045"
    ],
    "landingPage": "",
    "title": "Evaluation of a new Prototype of Secondary Voltage Standard with a Programmable Josephson Voltage Standard",
    "description": "This paper evaluates the short-term and long-term performance of a new type of dc secondary voltage standard at 10 V by direct comparison to a programmable Josephson voltage standard. Allan deviation measurements indicated a noise floor of 4.5 nV, enabling potential new applications in voltage metrology and possibly reducing uncertainty along the dissemination chain from primary calibration laboratories to calibration laboratories.",
    "language": [
        "en"
    ],
    "distribution": [
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-4087\/Fig%201%20AD%20and%20voltage%20stability.csv",
            "description": "Figure 1 presents the Allan deviation (AD) results (Fig. 1a) obtained at 10 V and 100 mV, and stability of the 10 V output of the Z10 (Unit 1) over a 24-hour period (Fig. 1b) measured with the NIST Programmable Josephson Voltage Standard",
            "mediaType": "text\/csv",
            "title": "Fig 1 AD and voltage stability"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-4087\/Fig%202%20Long-term%20stability.csv",
            "description": "Figure 2 presents Long-term stability data collected for the 10 V output voltage tap of two Z10 units (labelled Unit 1 and Unit 2) measured with the NIST Programmable Josephson Voltage Standard",
            "mediaType": "text\/csv",
            "title": "Fig 2 Long-term stability.csv"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-4087\/Fig%203%20DAC%20INL%20results.csv",
            "description": "Figure 3 presents the Integral Non-Linearity (INL) of the DAC output measured with the NIST Programmable Josephson Voltage Standard",
            "mediaType": "text\/csv",
            "title": "Fig 3 DAC INL results.csv"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-4087\/Fig%204%20DAC%20100%20mV%20voltage%20stability.csv",
            "description": "Figure 4 presents the stability of the DAC voltage output at 100 mV over a 24-hour period measured with the NIST Programmable Josephson Voltage Standard",
            "mediaType": "text\/csv",
            "title": "Fig 4 DAC 100 mV voltage stability.csv"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-4087\/4087_README.txt",
            "description": "Description of the data set",
            "mediaType": "text\/plain",
            "title": "Read Me file"
        }
    ],
    "bureauCode": [
        "006:55"
    ],
    "modified": "2026-02-03 00:00:00",
    "publisher": {
        "@type": "org:Organization",
        "name": "National Institute of Standards and Technology"
    },
    "theme": [
        "Metrology:Electrical\/electromagnetic metrology"
    ],
    "keyword": [
        "Digital-analog conversion",
        "Measurement uncertainty",
        "Josephson junctions",
        "Standards",
        "Superconducting integrated circuits",
        "Voltage measurement."
    ]
}