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1624 results found

SRM 3150 Silicon (Si) Standard Solution, Lot No. 130912

Data provided by  National Institute of Standards and Technology

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of silicon. A unit of SRM 3150 consists of 50 mL of solution prepared gravimetrically to contain a known mass fraction of silicon in a high-density polyethylene bottle sealed in an aluminized bag. The solution is prepared gravimetrically from sodium metasilicate nonahydrate to contain a known mass fraction of silicon in water. This data is public in the Certificate of Analysis for this material.

Tags: silicon,pure materials,cations,metals,single element solutions,spectrometry,Advanced Materials,

Modified: 2024-02-22

Views: 0

SRM 3151 Silver (Ag) Standard Solution Lot No. 160729

Data provided by  National Institute of Standards and Technology

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of silver. A unit of SRM 3151 consists of five 10 mL sealed borosilicate glass ampoules of an acidified aqueous solution prepared gravimetrically to contain a known mass fraction of silver. The solution contains nitric acid at a mass fraction of approximately 14 %. This data is public in the Certificate of Analysis for this material.

Tags: silver,pure materials,cations,metals,single element solutions,spectrometry,Advanced Materials,

Modified: 2024-02-22

Views: 0

SRM 3156 Tellurium (Te) Standard Solution Lot No. 140830

Data provided by  National Institute of Standards and Technology

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of tellurium. A unit of SRM 3156 consists of five 10 mL sealed borosilicate glass ampoules of an acidified aqueous solution prepared gravimetrically to contain a known mass fraction of tellurium. The solution contains hydrochloric acid at a volume fraction of approximately 10 %, which is equivalent to an amount of substance concentration (molarity) of approximately 1.2 mol/L. This data is public in the Certificate of Analysis for this material.

Tags: tellurium,pure materials,cations,metals,single element solutions,spectrometry,Advanced Materials,

Modified: 2024-02-22

Views: 0

SRM 3158 Thallium (Tl) Standard Solution Lot No. 993012

Data provided by  National Institute of Standards and Technology

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of thallium. A unit of SRM 3158 consists of five 10 mL sealed borosilicate glass ampoules of an acidified aqueous solution prepared gravimetrically to contain a known mass fraction of thallium. The solution contains nitric acid at a volume fraction of approximately 10 %. This data is public in the Certificate of Analysis for this material.

Tags: thallium,pure materials,cations,metals,single element solutions,spectrometry,Advanced Materials,

Modified: 2024-02-22

Views: 0

SRM 3165 Vanadium (V) Standard Solution Lot No. 992706

Data provided by  National Institute of Standards and Technology

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of vanadium. A unit of SRM 3165 consists of five 10 mL sealed borosilicate glass ampoules of an acidified aqueous solution prepared gravimetrically to contain a known mass fraction of vanadium. The solution contains nitric acid at an amount of substance concentration (molarity) of approximately 1.6 mol/L. This data is public in the Certificate of Analysis for this material.

Tags: vanadium,pure materials,cations,metals,single element solutions,spectrometry,Advanced Materials,

Modified: 2024-02-22

Views: 0

FIZ/NIST Inorganic Crystal Structure Database (ICSD) - SRD 84

Data provided by  National Institute of Standards and Technology

The Inorganic Crystal Structure Database (ICSD) is produced cooperatively by the Fachinformationszentrum Karlsruhe (FIZ) and the National Institute of Standards and Technology (NIST). Components and devices used in a broad spectrum of technology sectors such as health care, communications, energy and electronics are manufactured from crystalline materials; the development of advanced crystalline materials requires accurate crystal-structure data.

Tags: Rietveld profiles,X ray crystallography,X ray diffraction,X rays,XRD,absolute configurations,chemical structures,crystal data,crystal structures,crystallography,crystals,defect structures,diffraction,disorders,electron diffractions,electrons,identification,inorganic,inorganic structures,magnetic structures,materials,metals,mineral names,minerals,mixed crystal solid solutions,mixed crystals,modulated structures,neutron diffractions,neutrons,nuclear magnetic resonance,polytype structures,powder simulations,power,powers,prediction,simulations,single crystals,structure predictions,structures,synchroton radiations,twinned crystals,visualizations,x ray diffractions,

Modified: 2024-02-22

Views: 0

SRM 3102a Antimony (Sb) Standard Solution Lot No. 140911

Data provided by  National Institute of Standards and Technology

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of antimony. A unit of SRM 3102a consists of 50 mL of an acidified aqueous solution prepared gravimetrically to contain a known mass fraction of antimony in a high-density polyethylene bottle sealed in an aluminized bag.

Tags: antimony,pure materials,cations,metals,single element solutions,spectrometry,Advanced Materials,

Modified: 2024-02-22

Views: 0

Jun 1994 Current Population Survey: Basic Monthly

Data provided by  United States Census Bureau

To provide estimates of employment, unemployment, and other characteristics of the general labor force, of the population as a whole, and of various subgroups of the population. Monthly labor force data for the country are used by the Bureau of Labor Statistics (BLS) to determine the distribution of funds under the Job Training Partnership Act. These data are collected through combined computer-assisted personal interviewing (CAPI) and computer-assisted telephone interviewing (CATI).

Tags: census,

Modified: 2024-05-26

Views: 0

1986 County Business Patterns: Business Patterns

Data provided by  United States Census Bureau

County Business Patterns (CBP) is an annual series that provides economic data by industry at the U.S., State, County and Metropolitan Area levels. This series includes the number of establishments, employment during the week of March 12, first quarter payroll, and annual payroll. CBP provides statistics for businesses with paid employees for the U.S., Puerto Rico, and the Island Areas. Census Bureau staff identified a processing error that affects selected data from the 2014 County Business Patterns (CBP).

Tags: census,

Modified: 2024-05-26

Views: 0

1994 County Business Patterns - Zip Code Business Patterns: Total For Zip Code

Data provided by  United States Census Bureau

ZIP Code Business Patterns (ZBP) is an annual series that provides economic data by ZIP Code. This table includes the number of establishments, employment during the week of March 12, first quarter payroll, and annual payroll for All Industries by 5-digit ZIP Code. All Industries is set using SIC=00 from 1994 to 1997 and then with NAICS=00 from 1998 to present.

Tags: census,

Modified: 2024-05-26

Views: 0