The NIST DART-MS Forensics Database is an evaluated collection of in-source collisionally-induced dissociation (is-CID) mass spectra of compounds of interest to the forensics community (e.g. seized drugs, cutting agents, etc.). The is-CID mass spectra were collected using Direct Analysis in Real-Time (DART) Mass Spectrometry (MS), either by NIST scientists or by contributing agencies noted per compound. The database is provided as a general-purpose structure data file (.SDF).

Data for "Preparing for 6G: Developing best practices and standards for industrial measurements of low-loss dielectrics"

Digital light processing (DLP) vat photopolymerization (VP) additive manufacturing (AM) uses patterned UV light to selectively cure a liquid photopolymer into a solid layer. Subsequent layers are printed on to preceding layers to eventually form a desired 3 dimensional (3D) part. This data set characterizes the 3D geometry of a single layer of voxels (volume pixels) printed with photomasks assigned random intensity levels at every pixel. The masks are computer generated, then printed onto a glass cover slide.

Our work towards a Structured Evaluation Methodology for Artificial Intelligence Technology (SEMAIT) aims to provide plots, tools, methods, and strategies to extract insights out of various machine learning (ML) and Artificial Intelligence (AI) data.Included in this software is the MIg analyZeR (mizr) R software package that produces various plots.

This data publication contains the mass spectrometry chemical characterization of microplastic and nanoplastic chemical analysis. The data from this study includes mass spectra of pure, mixed, and weathered microplastics and nanoplastics at high and low fragmentation, extracted ion chronograms, Kendrick mass defect plots, code, and the derived and processed data. The data analysis code (MATLAB 2022a*) used for unsupervised learning of cluster and compositional relationships is also included.

This module for ns-3 implements the classes required to model a network architecture based on the O-RAN Alliance's specifications. These models include a Radio Access Network (RAN) Intelligent Controller (RIC) that is functionally equivalent to O-RAN's Near-Real Time (Near-RT) RIC, and reporting modules that attach to simulation nodes and serve as communication endpoints with the RIC in a similar fashion as the E2 Terminators in O-RAN.

This MEMS Calculator determines the following thin film properties from data taken with an optical interferometer or comparable instrument: a) residual strain from fixed-fixed beams, b) strain gradient from cantilevers, c) step heights or thicknesses from step-height test structures, and d) in-plane lengths or deflections. Then, residual stress and stress gradient calculations can be made after an optical vibrometer or comparable instrument is used to obtain Young's modulus from resonating cantilevers or fixed-fixed beams.

Interlaboratory data from assessments of SRMs and other method comparison samples

Standard Reference Material 131h Refined Cast Iron - This Standard Reference Material (SRM) is intended primarily for use in validation of chemical and instrumental methods of analysis. It can be used to validate value assignment of in-house reference materials and, if necessary, to calibrate carbon/sulfur analyzers. A unit of SRM 131h consists of a bottle containing 100 g of chips. This data is public in the Certificate of Analysis for this material.

Standard Reference Material 1632d Trace Elements in Coal (Bituminous) - This Standard Reference Material (SRM) is intended primarily for use in the evaluation of techniques used in the analysis of coals and materials of a similar matrix. A unit of SRM 1632d consists of 50 g of bituminous coal that was ground to pass a 250 µm (60 mesh) sieve, homogenized, bottled under an argon atmosphere, and sealed in an aluminized bag. This data is public in the Certificate of Analysis for this material.