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55 results found

SHREC'10 Track: Generic 3D Warehouse

Data provided by  National Institute of Standards and Technology

The objective of this track is to evaluate the performance of 3D shape retrieval approaches on a Generic 3D shape benchmark based on the Google 3D Warehouse.

Tags: 3D Shape Retrieval,3D Models,3D shape analysis,Evaluation and Measurement Science,

Modified: 2024-02-22

Views: 0

SHREC'10 track: Range scan retrieval

Data provided by  National Institute of Standards and Technology

The objective of this shape retrieval contest is to retrieve 3D models those are relevant to a query range scan. This task corresponds to a real life scenario where the query is a 3D range scan of an object acquired from an arbitrary view direction. The algorithm should retrieve the relevant 3D objects from a database.

Task description: In response to a given set of queries, the task is to evaluate similarity scores with the target models and return an ordered ranked list along with the similarity scores for each query. The set of query consists of range images.

Tags: 3D Shape Retrieval,3D Models,3D Range Scans,Evaluation,

Modified: 2024-02-22

Views: 0

SHREC'15: Range Scans based 3D Shape Retrieval

Data provided by  National Institute of Standards and Technology

The objective of this shape retrieval contest is to retrieve 3D models those are relevant to a query range scan. This task corresponds to a real life scenario where the query is a 3D range scan of an object acquired from an arbitrary view direction. The algorithm should retrieve the relevant 3D objects from a database.

Task description:
In response to a given set of range scan queries, the task is to evaluate similarity scores with the target models and return an ordered ranked list along with the similarity scores for each query.

Tags: Range Scans,3D Shape Retrieval,3D Models,Evaluation and Measurement Science,

Modified: 2024-02-22

Views: 0

SHREC'14 Track: Extended Large Scale Sketch-Based 3D Shape Retrieval

Data provided by  National Institute of Standards and Technology

The objective of SHREC'14 Track is to evaluate the performances of different sketch-based 3D model retrieval algorithms using a large scale hand-drawn sketch query dataset on a generic 3D model dataset.

Tags: 3D Shape Retrieval,3D Models,Sketches,Evaluation,

Modified: 2024-02-22

Views: 0

SHREC'14 Track: Large Scale Comprehensive 3D Shape Retrieval

Data provided by  National Institute of Standards and Technology

Objective:
The objective of this track is to evaluate the performance of 3D shape retrieval approaches on a large-sale comprehensive 3D shape database which contains different types of models, such as generic, articulated, CAD and architecture models.

Tags: 3D Shape Retrieval,Large-scale benchmark,Multimodal queries,Performance evaluation,Query-by-Model,Query-by-Example,Evaluation and measurement science.,

Modified: 2024-02-22

Views: 0

SHREC'12 Track: Generic 3D Shape Retrieval

Data provided by  National Institute of Standards and Technology

Objective: The objective of this track is to evaluate the performance of 3D shape retrieval approaches on Generic 3D Dataset.

Introduction: With the increasing number of 3D models are created every day and stored in databases, effectively searching a 3D repository for 3D shapes which are similar to a given 3D query model has become an important area of research. Benchmarking allows researchers to evaluate the quality of the results of different 3D shape retrieval approaches.

Tags: 3D Shape Retrieval,3D Models,Evaluation and Measurement Science,

Modified: 2024-02-22

Views: 0

SHREC'12 Track: Sketch-Based 3D Shape Retrieval

Data provided by  National Institute of Standards and Technology

The objective of this SHREC'12 track is to evaluate the performance of different sketch-based 3D model retrieval algorithms using both hand-drawn and standard line drawings sketch queries on a watertight 3D model dataset.

Tags: 3D Shape Retrieval,3D Models,Hand-drawn Sketch data,Standard line drawings,Evaluation,

Modified: 2024-02-22

Views: 0

Active Evaluation Software for Selection of Ground Truth Labels

Data provided by  National Institute of Standards and Technology

This software repository contains a python package Aegis (Active Evaluator Germane Interactive Selector) package that allows us to evaluate machine learning systems's performance (according to a metric such as accuracy) by adaptively sampling trials to label from an unlabeled test set to minimize the number of labels needed. This includes sample (public) data as well as a simulation script that tests different label-selecting strategies on already labelled test sets. This software is configured so that users can add their own data and system outputs to test evaluation.

Tags: active evaluation,machine learning,ar,

Modified: 2024-02-22

Views: 0

Simulated Radar Waveform and RF Dataset Generator for Incumbent Signals in the 3.5 GHz CBRS Band

Data provided by  National Institute of Standards and Technology

This software tool generates simulated radar signals and creates RF datasets. The datasets can be used to develop and test detection algorithms by utilizing machine learning/deep learning techniques for the 3.5 GHz Citizens Broadband Radio Service (CBRS) or similar bands. In these bands, the primary users of the band are federal incumbent radar systems. The software tool generates radar waveforms and randomizes the radar waveform parameters.

Tags: 3.5 GHz,CBRS,LTE,ESC,radar,radio frequency signals,spectrum,machine learning,deep learning,detection,

Modified: 2024-02-22

Views: 0

Optical scattering measurements and simulation data for one-dimensional (1-D) patterned periodic sub-wavelength features

Data provided by  National Institute of Standards and Technology

This data set consists of both measured and simulated optical intensities scattered off periodic line arrays, with simulations based upon an average geometric model for these lines. These data were generated in order to determine the average feature sizes based on optical scattering, which is an inverse problem for which solutions to the forward problem are calculated using electromagnetic simulations after a parameterization of the feature geometry.

Tags: electromagnetic simulations,simulations,experimental,angle-resolved scattering,scattering,gratings,patterned semiconductors,semiconductors,scatterfield microscopy,bright-field microscopy,microscopy,inverse problems,machine learning,

Modified: 2024-02-22

Views: 0