This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of silicon. A unit of SRM 3150 consists of 50 mL of solution prepared gravimetrically to contain a known mass fraction of silicon in a high-density polyethylene bottle sealed in an aluminized bag. The solution is prepared gravimetrically from sodium metasilicate nonahydrate to contain a known mass fraction of silicon in water. This data is public in the Certificate of Analysis for this material.

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of silver. A unit of SRM 3151 consists of five 10 mL sealed borosilicate glass ampoules of an acidified aqueous solution prepared gravimetrically to contain a known mass fraction of silver. The solution contains nitric acid at a mass fraction of approximately 14 %. This data is public in the Certificate of Analysis for this material.

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of tellurium. A unit of SRM 3156 consists of five 10 mL sealed borosilicate glass ampoules of an acidified aqueous solution prepared gravimetrically to contain a known mass fraction of tellurium. The solution contains hydrochloric acid at a volume fraction of approximately 10 %, which is equivalent to an amount of substance concentration (molarity) of approximately 1.2 mol/L. This data is public in the Certificate of Analysis for this material.

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of thallium. A unit of SRM 3158 consists of five 10 mL sealed borosilicate glass ampoules of an acidified aqueous solution prepared gravimetrically to contain a known mass fraction of thallium. The solution contains nitric acid at a volume fraction of approximately 10 %. This data is public in the Certificate of Analysis for this material.

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of vanadium. A unit of SRM 3165 consists of five 10 mL sealed borosilicate glass ampoules of an acidified aqueous solution prepared gravimetrically to contain a known mass fraction of vanadium. The solution contains nitric acid at an amount of substance concentration (molarity) of approximately 1.6 mol/L. This data is public in the Certificate of Analysis for this material.

This dataset contains thermographic measurements acquired during single and multiple track scans on bare substrates and on single layers of powder. The substrates and powder are nickel alloy 625 and the experiments are performed inside a commercial laser powder bed fusion machine. There are four experiment cases: 1) a single scan track on a bare substrate, 2) a single scan track on a single hand-spread layer of powder, 3) multiple (39) scan tracks covering an area on a bare substrate, and 4) multiple (39) scan tracks solidifying a single hand-spread layer of powder.

JARVIS (Joint Automated Repository for Various Integrated Simulations) is a repository designed to automate materials discovery using classical force-field, density functional theory, machine learning calculations and experiments.

The Force-field section of JARVIS (JARVIS-FF) consists of thousands of automated LAMMPS based force-field calculations on DFT geometries. Some of the properties included in JARVIS-FF are energetics, elastic constants, surface energies, defect formations energies and phonon frequencies of materials.

The Free Energy and Advanced Sampling Simulation Toolkit (FEASST) is a free, open-source, modular program to conduct molecular and particle-based simulations with flat-histogram Monte Carlo and molecular dynamics methods. It is a software written in C++ and python which is made publicly available to aid in reproducibility. It is also provided as a service to the scientific community in which there are few , if any, Monte Carlo programs that support flat histogram methods and advanced sampling algorithms. This software is expected to be updated frequently with new methods.

Source of the Refl1d program for modeling and analyzing neutron and X-ray reflectometry data, with the addition of distributed roughness capability.

The Additive Manufacturing Benchmark Test Series (AM-Bench) is developing a continuing series of controlled benchmark tests, in conjunction with a conference series, with two initial goals: 1) to allow modelers to test their simulations against rigorous, highly controlled additive manufacturing benchmark test data, and 2) to encourage additive manufacturing practitioners to develop novel mitigation strategies for challenging build scenarios.