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Life Cycle Assessment Models for Building Systems
Data provided by National Institute of Standards and Technology
This dataset is a set of life cycle assessment (LCA) models for select building systems and components that have been developed by the Applied Economics Office of the Engineering Laboratory. An LCA model consists of two components: an inventory and a dataset(s). An inventory compiles and quantifies environmentally relevant flows: products, materials (including waste and emissions), or energy as defined in ISO 14040. Datasets contain environmentally relevant information of the process producing or treating the related flow.
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Data associated with "Frequency-doubled chirped-pulse dual-comb generation in the near-UV: Combined vs separated beam investigations of Rb atoms near 420 nm" accepted for publication in Scientific Reports (2025).
Data provided by National Institute of Standards and Technology
Data associated with "Frequency-doubled chirped-pulse dual-comb generation in the near-UV: Combined vs separated beam investigations of Rb atoms near 420 nm" accepted for publication in Scientific Reports (2025).
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Time-gated Raman plasticizer library
Data provided by National Institute of Standards and Technology
This library consists of time gated Raman spectra of 91 plasticizers included in the Scientific Polymer Products Inc. Plasticizer Kit‡. The sample list can be found in the file: SampleDetails.csv. Plasticizers were measured at least in duplicate. Data was collected on a PicoRaman spectrometer (Timegate Instruments) using a 532 nm pulsed laser. The spectrometer was coupled through a fiber-optic probe (BAC102, B&W Tek). Sampling conditions were selected to minimize measured fluorescence and accompanying noise in the time gated window.
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Detection Limits for SEM Image Segmentation
Data provided by National Institute of Standards and Technology
The dataset consists of six collections of SEM images, three trained U-net AI models, and CSV files with image quality metrics and trained AI model accuracy metrics. Each SEM image collection contains images augmented with Poisson noise and contrast.
This work was performed with funding from the CHIPS Metrology Program, part of CHIPS for America, National Institute of Standards and Technology, U.S. Department of Commerce.
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"Construction of Amorphous Structure Models via Relaxation of Random Arrangements of Molecules" dataset.
Data provided by National Institute of Standards and Technology
Dataset and workflow for the Construction of Amorphous Structure Models via Relaxation of Random Arrangements of Molecules. This is associated with manuscript "Construction of Amorphous Structure Models via Relaxation of Random Arrangements of Molecules" by Jarod Worden, Eric Cockayne, and Kevin F. Garrity. The primary investigated systems are silicon, SiO2, HfO2, ZrCu, and Al2O3.
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Evidence Management Steering Committee Report: Data
Data provided by National Institute of Standards and Technology
In 2018 in conjunction with the National Institute of Justice (NIJ), the National Institute of Standards and Technology (NIST) assembled a group of multidisciplinary experts, the Evidence Management Steering Committee (EMSC), to develop a plan to (1) provide recommendations for the retention, preservation, integrity, and disposition of evidence and property and (2) encourage the adoption of practice improvements, through education and engagement, of the broad community of U.S. justice system stakeholders involved in evidence management.
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Data for "Direct detection of the ∼ 8.4 eV internal conversion energy of 229mTh embedded in a superconducting nanowire"
Data provided by National Institute of Standards and Technology
Data for "Direct detection of the ∼ 8.4 eV internal conversion energy of 229mTh embedded in a superconducting nanowire"
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AM Bench 2018 measurement results data: optical microscopy of laser-scanned single tracks on nickel Alloy 625 plates (AMB2018-02)
Data provided by National Institute of Standards and Technology
The following optical micrograph data files are provided in support of the AM Bench 2018 modeling challenges associated with bare plate single track laser scans performed on the NIST Additive Manufacturing Metrology Testbed. These measurements were used in the AMB2018-02 set of challenges associated with track melt pool geometry (CHAL-AMB2018-02-MP).
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Using Monte Carlo Methods to Compute the Uncertainty of Fracture Toughness and Fracture Resistance Curves
Data provided by National Institute of Standards and Technology
Monte Carlo samples of fracture toughness curve parameters using multiple possible distributions for the noise. Added noise is based on the uncertainty budget, but also explores sensitivity of various combinations of parameters versus letting all parameters vary simultaneously.
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Rocky Mountain Ellipse Digital Traceability Software
Data provided by National Institute of Standards and Technology
Rocky Mountain Ellipse (RME) is a software package designed to provide an explicit digital record of the metrological traceability of a measurement result. In other words, RME will allows users to build a record that describes how a measurement result can be related to a reference through a documented unbroken chain of calibrations, each contributing to the measurement uncertainty (https://jcgm.bipm.org/vim/en/2.41.html).
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