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Software and data associated with ``DeJaco, R. F.; Roberts, M. J.; Romsos, E. L.; Vallone, P. M.; Kearsley, A. J. Reducing Bias and Quantifying Uncertainty in Fluorescence Produced by PCR *Under Review*, 2023.''

Data provided by  National Institute of Standards and Technology

The purpose of this code and data is to enable reproduction
and facilitate extension of the computational
results associated with following work

DeJaco, R. F.; Roberts, M. J.; Romsos, E. L.; Vallone, P. M.; Kearsley, A. J.
Reducing Bias and Quantifying Uncertainty in Fluorescence Produced by PCR
*Under Review*, 2023.

Modified:

NIST Database of the Thermophysical Properties of Gases Used in the Semiconductor Industry

Data provided by  National Institute of Standards and Technology

The 1999 Semiconductor Industry Association (SIA) International Technology Roadmap for Semiconductors (ITRS) identifies 'Equipment Modeling' as first in a list of 'Technology Requirements' and states that 'the drivers for equipment modeling are equipment design, process control, . . . ' The ITRS indicates that continuing research is needed to obtain experimental data for 'transport and thermal constants.' This Project will generate transport and thermodynamic property data for the gases used in semiconductor processing.

Modified:

Source: https://doi.org/10.18434/t4r599

Optimal Bayesian Experimental Design Version 1.2.0

Data provided by  National Institute of Standards and Technology

Python module 'optbayesexpt' uses optimal Bayesian experimental design methods to control measurement settings in order to efficiently determine model parameters. Given an parametric model - analogous to a fitting function - Bayesian inference uses each measurement 'data point' to refine model parameters. Using this information, the software suggests measurement settings that are likely to efficiently reduce uncertainties. A TCP socket interface allows the software to be used from experimental control software written in other programming languages.

Modified:

Correlation-Matrix Approaches for Testing Wireless Devices in Reverberation Chambers

Data provided by  National Institute of Standards and Technology

The data correspond to the paper Practical Correlation-Matrix Approaches for Standardized Testing of Wireless Devices in Reverberation Chambers. Abstract: We extend the autocorrelation-based approaches currently used in standards to full correlation matrix-based approaches in order to identify correlation between both spatially adjacent and non-adjacent samples in reverberation-chamber measurements. We employ a scalar metric that allows users to identify the number of effectively uncorrelated samples in new types of stirring sequences.

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Supporting Info for Synergistic Fire Resistance of Nanobrick Wall Coated 3D Printed Photopolymer Lattices

Data provided by  National Institute of Standards and Technology

Videos and .stl files from Synergistic Fire Resistance of Nanobrick Wall Coated 3D Printed Photopolymer Lattices.

The videos are from the fire tests of 3D printed photopolymer parts, from which time series still images were acquired. In these tests, printed parts (with or without a nanocoating) are subjected to direct blowtorch exposure until part failure (defined as when the part shatters). Most videos include time after torch removal while the part continues to burn.

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Data for "A distributed theory for contactless interconnects at terahertz frequencies"

Data provided by  National Institute of Standards and Technology

Included here are figures and other relevant data from the paper "A distributed theory for contactless interconnects at terahertz frequencies". Abstract: Here we test a multimodal model for distributed contactless interconnects by comparing it to 3D full-wave simulations. In comparison to 3D simulations, the model offers insight into how the interconnect works and reduces the computational cost of estimating the interconnect?s performance.

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Data for "Distributed contactless interconnects for millimeter-wave heterogeneous integration"

Data provided by  National Institute of Standards and Technology

Included here are figures and other relevant data from the paper "Distributed contactless interconnects for millimeter-wave heterogeneous integration", submitted to TMTT Letters. Abstract: State-of-the-art integrated circuits leverage dissimilar materials to optimize system performance. Such heterogeneous integration often involves multiple chips electrically coupled to one another via bump bonds or wire-bond interconnects.

Modified:

Historic test velocity data used for chronograph/light screen system uncertainty analysis.

Data provided by  National Institute of Standards and Technology

Projectile velocity data, from tests using the National Institute of Justice (NIJ) body armor standard (NIJ-0101.06) test threats, collected over a numbers of years at the NIST ballistics laboratory, that was used to assess the uncertainty associated with a chronograph/light screen system.

Modified:

Trojan Detection Software Challenge - cyber-pdf-dec2022-train

Data provided by  National Institute of Standards and Technology

Round 12 Train Dataset

Modified:

Source: https://drive.google.com/drive/folders/1D-JPRFSNBvCFjRJhiGZqNTeA7jx2fD2y

Trojan Detection Software Challenge - cyber-pdf-dec2022-holdout

Data provided by  National Institute of Standards and Technology

Round 12 Holdout Dataset

Modified:

Source: https://drive.google.com/drive/folders/11UAG70H6OzDJ_XoarrBcuIWZNDstpocn?usp=drive_link