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109 results found

Trademark Official Gazettes (2013 - Present (searchable))

Data provided by  United States Patent and Trademark Office

Contains bibliographic (front page) information and a representative drawing (if applicable) for each trademark registration or trademark application published that week. Incluides a list of cancelled and renewed registrations.

Tags: tuesday,uspto,pdf,trademark,official,gazette,tmog,

Modified: 2024-02-22

Views: 0

Trademark Official Gazettes (2001 - 2021 Archive in PDF)

Data provided by  United States Patent and Trademark Office

Contains bibliographic (front page) information and a representative drawing (if applicable) for each trademark registration or trademark application published that week. Incluides a list of cancelled and renewed registrations.

Tags: tuesday,uspto,pdf,trademark,official,gazette,tmog,

Modified: 2024-02-22

Views: 0

Trademark Image Search API (beta)

Data provided by  United States Patent and Trademark Office

The Trademark Image Search API (beta) allows searching Trademark Images using various attributes like feature, accuracy, metricspaces and candidates. This API also allows searching Trademark documents using various metadata attributes like Specimen Description, Filing Description, Filing Basis, Owner's Name, Street Address, etc.

Tags: uspto,trademark,image,search,api,

Modified: 2024-02-22

Views: 0

Trademark Status and Document Retrieval (TSDR) API (beta)

Data provided by  United States Patent and Trademark Office

The Trademark Status and Document Retrieval (TSDR) API allows you to make programmatic requests for trademark case status, documents, and images. Beginning on October 2, 2020, you will need an API key to download bulk data from TSDR using the TSDR API. Using API keys will help optimize usage of our TSDR system, which will help enable users like yourself to better access the information you need from TSDR. The below resources will provide you with more information on using the TSDR API.

Tags: uspto,trademark,status,image,search,api,

Modified: 2024-02-22

Views: 0

Trademark Case Files Dataset for Academia and Researchers (1870 - 2021)

Data provided by  United States Patent and Trademark Office

Contains detailed information on 7.0 million trademark applications filed with or registrations issued by the USPTO between 1870 and 2020.

Tags: trademark,uspto,application,classification,number,csv,design search code,dta,filing date,goods and services,pending,pseudo mark,registered,registration date,registration number,serial number,stata,status code,text,word mark,

Modified: 2024-02-22

Views: 0

Trademark Assignment Data for Academia and Researchers (1952 - 2021)

Data provided by  United States Patent and Trademark Office

Contains detailed information on 786,931 assignments and other transactions recorded at the USPTO between 1952 and 2020 and involving 1,491,485 million unique trademark properties.

Tags: trademark,uspto,application,assignment,change,csv,dta,ownership,pending,recordation,registered,stata,text,

Modified: 2024-02-22

Views: 0

NIST Inorganic Crystal Structure Database (ICSD)

Data provided by  National Institute of Standards and Technology

Materials discovery and development necessarily begins with the preparation and identification of product phase(s). Crystalline compounds can be identified by their characteristic diffraction patterns using X-rays, neutrons, and or electrons. An estimated 20,000 X-ray diffractometers and a comparable number of electron microscopes are used daily in materials research and development laboratories for this purpose.

Tags: chemical structures,crystallography,crystal structures,diffraction,disorder,electrons,identification,inorganic,neutrons,magnetic,metals,minerals,materials,Rietveld,synchrotron,twinned,x-rays,Advanced Materials,manufacturing,Safety,Security and Forensics,

Modified: 2024-02-22

Views: 0

Optical Modeling of Single Asian Dust and Marine Air Particles: A Comparison with Geometric Particle Shapes for Remote Sensing

Data provided by  National Institute of Standards and Technology

The project that produced these data involved the analysis and modeling of atmospheric Asian dust particles and background marine air particles collected in Hawaii, USA at the Mauna Loa Observatory (MLO) of the National Oceanic and Atmospheric Administration. Individual heterogeneous dust particles were analyzed with focused ion-beam scanning electron microscopy and energy-dispersive X-ray spectroscopy.

Tags: atmospheric aerosol,Asian dust,light scattering,light absorption,radiative forcing,climate change,focused ion-beam scanning electron microscopy,FIB-SEM,energy-dispersive X-ray spectroscopy,EDX,focused ion-beam tomography,optical property modeling,discrete dipole approximation method,Environment and Climate,

Modified: 2024-02-22

Views: 0

Comparison of primary laser spectroscopy and mass spectrometry methods for measuring mass concentration of gaseous elemental mercury

Data provided by  National Institute of Standards and Technology

Data for mass concentration analysis and spectral analysis for the paper titled, "Comparison of primary laser spectroscopy and mass spectrometry methods for measuring mass concentration of gaseous elemental mercury"

Tags: mercury,laser absorption spectroscopy,Standard Generator,SI traceability,ID-CV-ICP-MS,primary measurement method,Environment and Climate,

Modified: 2024-02-22

Views: 0

SRM 3104a Barium (Ba) Standard Solution Lot No. 140909

Data provided by  National Institute of Standards and Technology

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of barium. A unit of SRM 3104a consists of five 10 mL sealed borosilicate glass ampoules of an acidified aqueous solution prepared gravimetrically to contain a known mass fraction of barium. The solution contains nitric acid at a volume fraction of approximately 1 %, which is equivalent to a concentration (molarity) of approximately 0.16 mol/L. This data is public in the Certificate of Analysis for this material.

Tags: barium,pure materials,cations,metals,single element solutions,spectrometry,Advanced Materials,

Modified: 2024-02-22

Views: 0