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Experimental data, refined configurations, and other necessary input to RMCProfile used in structural refinements reported in the paper "Emergent topological polarization textures in relaxor ferroelectrics" by M. Eremenko, V. Krayzman, S. Gorfman, A. Bosak, H. Y. Playford, P. A. Chater, B. Ravel, W. J. Laws, F. Ye, A. Minelli, B.-X. Wang, Z-G. Ye, M. G. Tucker, I. Levin.
Data provided by National Institute of Standards and Technology
This zip file contains experimental data, refined configurations, and other necessary input to RMCProfile used in structural refinements reported in the paper "Emergent topological polarization textures in relaxor ferroelectrics" by M. Eremenko, V. Krayzman, S. Gorfman, A. Bosak, H. Y. Playford, P. A. Chater, B. Ravel, W. J. Laws, F. Ye, A. Minelli, B.-X. Wang, Z-G. Ye, M. G. Tucker, I. Levin.
Tags: Advanced Materials
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Data and input files associated with "Bloch-state optimal basis sets: An efficient approach for electronic structure interpolation"
Data provided by National Institute of Standards and Technology
Data and input files for publication "Bloch-state optimal basis sets: An efficient approach for electronic structure interpolation"
Tags: x-ray absorption,x-ray emission,Advanced Materials,Energy
Modified:
Source: https://datapub.nist.gov/od/id/mds2-3590
4D-STEM characterization results from a thermal annealing series of poly(3[2-(2-methoxyethoxy)ethoxy]-methylthiophene-2,5-diyl) organic electrochemical transistor films
Data provided by National Institute of Standards and Technology
This repository contains two types of datasets: 4D-STEM data collected from a thermal annealing series of P3MEEMT films. 4D-STEM data:Dose series: Collected from P3MEEMT film annealed at 115 C. Each HDF5 file was generated from the raw data using the fpdpy software package to reshape and embed metadata. No other preprocessing was performed. Annealing series: Collected from P3MEEMT films annealed at 75 C, 115 C, 145 C, and 175 C. Each temperature contains two sets of 4D-STEM data collected at low and high magnification.
Tags: Advanced Materials,Organic Semiconductors,4D-STEM,OECT,TEM,GIWAXS
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Thermal Conductivity of Binary Mixtures of 1,1,1,2-Tetrafluoroethane(R-134a), 2,3,3,3-Tetrafluoropropene (R-1234yf), and trans-1,3,3,3-Tetrafluoropropene (R-1234ze(E)) Refrigerants
Data provided by National Institute of Standards and Technology
Workflow: The data that falls into this category are gathered from a measurement program and are published in the archival literature.
Tags: Advanced Materials,Energy,Environment and Climate,Physical Infrastructure,Safety,Security and Forensics
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Speed of Sound Measurements of Binary Mixtures of Difluoromethane (R-32) with 2,3,3,3-Tetrafluoropropene (R-1234yf) or trans-1,3,3,3-Tetrafluoropropene (R-1234ze(E)) Refrigerants
Data provided by National Institute of Standards and Technology
Speed of Sound Measurements of Binary Mixtures of Difluoromethane (R-32) with 2,3,3,3-Tetrafluoropropene (R-1234yf) or trans-1,3,3,3-Tetrafluoropropene (R-1234ze(E)) Refrigerants
Tags: Advanced Materials,Energy,Environment and Climate,Physical Infrastructure,Safety,Security and Forensics
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NIST/ARPA-E Database of Novel and Emerging Adsorbent Materials
Data provided by National Institute of Standards and Technology
The NIST/ARPA-E Database of Novel and Emerging Adsorbent Materials is a free, web-based catalog of adsorbent materials and measured adsorption properties of numerous materials obtained from article entries from the scientific literature. Search fields for the database include adsorbent material, adsorbate gas, experimental conditions (pressure, temperature), and bibliographic information (author, title, journal), and results from queries are provided as a list of articles matching the search parameters.
Tags: adsorbate,adsorbent,adsorption,isotherm,metal organic Framework,porous Material,surface science,Advanced Materials,Energy,Environment and Climate,manufacturing
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Source: https://adsorption.nist.gov/isodb/index.php#apis
NIST Inorganic Crystal Structure Database (ICSD)
Data provided by National Institute of Standards and Technology
Materials discovery and development necessarily begins with the preparation and identification of product phase(s). Crystalline compounds can be identified by their characteristic diffraction patterns using X-rays, neutrons, and or electrons. An estimated 20,000 X-ray diffractometers and a comparable number of electron microscopes are used daily in materials research and development laboratories for this purpose.
Tags: chemical structures,crystallography,crystal structures,diffraction,disorder,electrons,identification,inorganic,neutrons,magnetic,metals,minerals,materials,Rietveld,synchrotron,twinned,x-rays,Advanced Materials,manufacturing,Safety,Security and Forensics
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Source: https://icsd.nist.gov
NanoUV-VIS- An interactive visualization tool for monitoring the evolution of optical properties of nanoparticles throughout synthesis reactions.
Data provided by National Institute of Standards and Technology
Shiny app for monitoring the evolution of optical properties of nanoparticles throughout synthesis reactions.
Tags: Advanced Functional Materials,Advanced Materials
Modified:
Source: https://doi.org/10.18434/M3T952
SRM 671 Nickel Oxide No. 1
Data provided by National Institute of Standards and Technology
SRM 671 Nickel Oxide, No. 1 - Standard Reference Material 671, Nickel Oxide No. 1 has been discontinued and is no longer being produced. The data is public in the Certificate of Analysis for this material.
Tags: Advanced Materials
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SRM 672 Nickel Oxide No. 2
Data provided by National Institute of Standards and Technology
Standard Reference Material 672 Nickel Oxide, No. 2 has been discontinued and is no longer being produced. The data is public in the Certificate of Analysis for this material.
Tags: Advanced Materials
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