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63 results found

Patent Litigation Docket Report Data Files for Academia and Researchers (1963 - 2016)

Data provided by  United States Patent and Trademark Office

Contains detailed U.S. District Courts patent litigation data on 74,623 unique court cases filed during the period 1963 - 2016. The data was collected from the Public Access to Court Electronic Records (PACER) and RECAP as sources for all of the content.

Tags: csv,dta,stata,uspto,patent,patent application,litigation,court,docket,pacer,

Modified: 2024-02-22

Views: 0

Patent Maintenance Fee Events (1981 - Present)

Data provided by  United States Patent and Trademark Office

Contains recorded maintenance fee events for patents granted from September 1, 1981 to present. Each new weekly file is cumulative.

Tags: tuesday,uspto,ascii,patent,grant,event code,maintenance fee,

Modified: 2024-02-22

Views: 0

Patent Official Gazettes (2002 - Present)

Data provided by  United States Patent and Trademark Office

Contains bibliographic (front page) information, a representative claim, and a drawing (if applicable) of each patent grant issued that week. Includes U.S. Patent and Trademark Office Notices which provide important information and changes in rules concerning both patents and trademarks.

Tags: tuesday,uspto,html,gif,patent grant,official,gazette,notices,

Modified: 2024-02-22

Views: 0

PatentsView API (Version 1.0.0)

Data provided by  United States Patent and Trademark Office

The PatentsView API is intended to inspire the exploration and enhanced understanding of US intellectual property (IP) and innovation systems. The database driving the API is regularly updated and integrates the best available tools for inventor disambiguation and data quality control. We hope researchers and developers alike will explore the API to discover people and companies and to visualize trends and patterns across the US innovation landscape.

Tags: uspto,patent,patent application,visualization,oce,api,

Modified: 2024-02-22

Views: 0

Trademark Official Gazettes (2013 - Present (searchable))

Data provided by  United States Patent and Trademark Office

Contains bibliographic (front page) information and a representative drawing (if applicable) for each trademark registration or trademark application published that week. Incluides a list of cancelled and renewed registrations.

Tags: tuesday,uspto,pdf,trademark,official,gazette,tmog,

Modified: 2024-02-22

Views: 0

Trademark Official Gazettes (2001 - 2021 Archive in PDF)

Data provided by  United States Patent and Trademark Office

Contains bibliographic (front page) information and a representative drawing (if applicable) for each trademark registration or trademark application published that week. Incluides a list of cancelled and renewed registrations.

Tags: tuesday,uspto,pdf,trademark,official,gazette,tmog,

Modified: 2024-02-22

Views: 0

Measurement Dataset for A Wireless Gantry System

Data provided by  National Institute of Standards and Technology

This dataset includes the position data of a two-dimensional gantry system experiment in which the G-code commands for the gantry were transmitted through a wireless communications link. The testbed is composed of four main components related to the operation of the gantry system. These components are the gantry system, the Wi-Fi network, the RF channel emulator, and the supervisory computer. In the experimental study, we run a scenario in which the gantry tool moves sequentially between four positions and has a preset dwell at each of the positions.

Tags: wireless,manufacturing,cyber-physical systems,robotics,gantry,

Modified: 2024-02-22

Views: 0

NIST Inorganic Crystal Structure Database (ICSD)

Data provided by  National Institute of Standards and Technology

Materials discovery and development necessarily begins with the preparation and identification of product phase(s). Crystalline compounds can be identified by their characteristic diffraction patterns using X-rays, neutrons, and or electrons. An estimated 20,000 X-ray diffractometers and a comparable number of electron microscopes are used daily in materials research and development laboratories for this purpose.

Tags: chemical structures,crystallography,crystal structures,diffraction,disorder,electrons,identification,inorganic,neutrons,magnetic,metals,minerals,materials,Rietveld,synchrotron,twinned,x-rays,Advanced Materials,manufacturing,Safety,Security and Forensics,

Modified: 2024-02-22

Views: 0

Smart Investment Tool

Data provided by  National Institute of Standards and Technology

This tool calculates metrics for investment analysis documented in NIST Advanced manufacturing Series 200-5. It calculates net present value, internal rate of return, and payback period along with executing sensitivity analysis using Monte Carlo techniques. The tool helps to identify the most economical projects/investments. For instance, it could be used to identify the most economical heating and cooling system or it might be used to rank a set of potential investments.

Tags: net present value,internal rate of return,payback,investment,monte carlo,manufacturing,cost effective,economics,

Modified: 2024-02-22

Views: 0

SRM 635a Portland Cement (Blended with Slag)

Data provided by  National Institute of Standards and Technology

SRM 635a Portland Cement (Blended with Slag) - This Standard Reference Material (SRM) is intended primarily for use in validation of chemical and instrumental methods of analysis of cements and materials of similar matrix for elemental contents. It can be used to validate value assignment of in-house reference materials. This data is public in the Certificate of Analysis for this material.

Tags: manufacturing,

Modified: 2024-02-22

Views: 0