This dataset was an initial test harness infrastructure test for the TrojAI program. It should not be used for research. Please use the more refined datasets generated for the other rounds. The data being generated and disseminated is training, validation, and test data used to construct trojan detection software solutions. This data, generated at NIST, consists of human level AIs trained to perform a variety of tasks (image classification, natural language processing, etc.).

Data files for the publication "High Accuracy Near-infrared Carbon Dioxide Intensity Measurements to Support Remote Sensing" in Geophysical Research Letters

This software repository contains a python package Aegis (Active Evaluator Germane Interactive Selector) package that allows us to evaluate machine learning systems's performance (according to a metric such as accuracy) by adaptively sampling trials to label from an unlabeled test set to minimize the number of labels needed. This includes sample (public) data as well as a simulation script that tests different label-selecting strategies on already labelled test sets. This software is configured so that users can add their own data and system outputs to test evaluation.

This software tool generates simulated radar signals and creates RF datasets. The datasets can be used to develop and test detection algorithms by utilizing machine learning/deep learning techniques for the 3.5 GHz Citizens Broadband Radio Service (CBRS) or similar bands. In these bands, the primary users of the band are federal incumbent radar systems. The software tool generates radar waveforms and randomizes the radar waveform parameters.

NeXLCore.jl represents the basic physics related data and algorithms necessary to interpret and understand X-ray emission.

This data set consists of both measured and simulated optical intensities scattered off periodic line arrays, with simulations based upon an average geometric model for these lines. These data were generated in order to determine the average feature sizes based on optical scattering, which is an inverse problem for which solutions to the forward problem are calculated using electromagnetic simulations after a parameterization of the feature geometry.

The first version of HVACSIM+, which stands for "HVAC SIMulation PLUS other systems", was introduced by National Institute of Standards and Technology (NIST) in 1985 as a computer simulation tool to simulate entire building systems. Since then, the HVACSIM+ computer program package and manuals have been distributed to researchers, students, and consultants in more than 40 countries around the world.

Standard Reference Material-1721: Southern Oceanic Air. Ambient Nominal Amount of Substance Fraction for Carbon Dioxide, Methane & Nitrous Oxide. This Standard Reference Material (SRM) is a primary gas mixture for which the amount-of-substance fraction, expressed as concentration, may be related to secondary working standards. This SRM is intended for the calibration of instruments used for ambient carbon dioxide (CO2), methane (CH4) and nitrous oxide (N2O) determinations and for other applications. This data is public in the Certificate of Analysis for this material.

All the data in this project are generated running Density Functional (DFT) simulation either on NIST computer clusters of through our collaborators at University of Florida. The final data consist in relaxed atomic structures and corresponding energetic, mechanical, electronic and phonon properties. The metadata consist in the initial and relaxed structures, the description of the code, of the k points and of all the parameters used in running the simulations (energy or real space cutoff, type of minimization, occupation, etc.).

Using a modified Thomas-Fermi approximation, we model a reference semiconductor system comprising a quasi-1D nanowire with a series of five depletion gates whose voltages determine the number of quantum dots (QDs), the charges on each of the QDs, as well as the conductance through the wire. The original dataset, QFlow lite, consists of 1 001 idealized simulated measurements with gate configurations sampling over different realizations of the same type of device.