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72 results found

Enriched Citation API (Version 1)

Data provided by  United States Patent and Trademark Office

The Enriched Citation API provides the Intellectual Property 5 (IP5 - EPO, JPO, KIPO, CNIPA, and USPTO) and the Public with greater insight into the patent evaluation process. It allows users to quickly view information about which references, or prior art, were cited in specific patent application Office Actions, including: bibliographic information of the reference, the claims that the prior art was cited against, and the relevant sections that the examiner relied upon.

Tags: uspto,ip5,enriched,citation,prior art,office action,claims,machine learning,ai,api,statutes,references

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Source: https://developer.uspto.gov/api-catalog/uspto-enriched-citation-api

Enriched Citation API (Version 2)

Data provided by  United States Patent and Trademark Office

The Enriched Citation API provides the Intellectual Property 5 (IP5 - EPO, JPO, KIPO, CNIPA, and USPTO) and the Public with greater insight into the patent evaluation process. It allows users to quickly view information about which references, or prior art, were cited in specific patent application Office Actions, including: bibliographic information of the reference, the claims that the prior art was cited against, and the relevant sections that the examiner relied upon.

Tags: uspto,ip5,enriched,citation,prior art,office action,claims,machine learning,ai,api,statutes,references

Modified:

Source: https://developer.uspto.gov/api-catalog/uspto-enriched-citation-api-v2

Enriched Citation API (Version 3)

Data provided by  United States Patent and Trademark Office

The Enriched Citation API provides the Intellectual Property 5 (IP5 - EPO, JPO, KIPO, CNIPA, and USPTO) and the Public with greater insight into the patent evaluation process. It allows users to quickly view information about which references, or prior art, were cited in specific patent application Office Actions, including: bibliographic information of the reference, the claims that the prior art was cited against, and the relevant sections that the examiner relied upon.

Tags: uspto,ip5,enriched,citation,prior art,office action,claims,machine learning,ai,api,statutes,references

Modified:

Source: https://developer.uspto.gov/api-catalog/uspto-enriched-citation-api-v3

Reference functional model for production in a circular economy

Data provided by  National Institute of Standards and Technology

Reference functional model for the activities and processes involved in production (e.g., designing, manufacturing, and recovering products/materials) in a circular economy. The model includes inputs and outputs of each activity, as well as factors that constrain and enable the activities (controls and mechanisms), using the IDEF0 methodology. It provides a baseline scenario that is relevant for stakeholders across product development and supply chain, including business strategists, material suppliers, designers, manufacturers, consumers, and recovers/recyclers.

Tags: circular economy,design,manufacturing,production,end-of-life treatment,functional model,system model

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Source: https://pages.nist.gov/circular-economy-manufacturing-models/

Figure files for "Modular Autonomous Virtualization System for Two-Dimensional Semiconductor Quantum Dot Arrays" submitted to Physical Review X

Data provided by  National Institute of Standards and Technology

The dataset underlying the figures in the manuscript is "Modular Autonomous Virtualization System for Two-Dimensional Semiconductor Quantum Dot Arrays."Abstract of the paper: Arrays of gate-defined semiconductor quantum dots are among the leading candidates for building scalable quantum processors. High-fidelity initialization, control, and readout of spin qubit registers require exquisite and targeted control over key Hamiltonian parameters that define the electrostatic environment.

Tags: machine learning,quantum dots,autonomous control,2D arrays,germanium quantum dots

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CHIPS-FF: Evaluating Universal Machine Learning Force Fields for Material Properties

Data provided by  National Institute of Standards and Technology

CHIPS-FF (Computational High-Performance Infrastructure for Predictive Simulation-based Force Fields) is a universal, open-source benchmarking platform for machine learning force fields (MLFFs). This platform provides robust evaluation beyond conventional metrics such as energy, focusing on complex properties including elastic constants, phonon spectra, defect formation energies, surface energies, and interfacial and amorphous phase properties.

Tags: force-field,machine learning,semiconductors,materials

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Source: https://github.com/usnistgov/chipsff

Data for Intrinsic DAC calculations

Data provided by  National Institute of Standards and Technology

Results of calculations and simulations for the Intrinsic Direct Air Capture analysis of Metal Organic Framwork (MOF) sorbents.Includes Grand Canonical Monte Carlo (GCMC) simulations, predictions of the Specific Heat Capacities (CV), and Intrinsic Direct Air Capture (DAC) calculations for MOF sorbents.

Tags: Direct Air Capture,machine learning,thermodynamics,Solid Sorbents,MOFs

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Source: https://doi.org/10.5281/zenodo.14452152

Sim-PROCESD: Simulated-Production Resource for Operations and Conditions Evaluation to Support Decision-making

Data provided by  National Institute of Standards and Technology

Sim-PROCESD is a discrete event simulation package written in Python that is designed to model the behavior of discrete manufacturing systems. Specifically, it focuses on asynchronous production lines. It also provides functionality for modeling the degradation and maintenance of machines in these systems. Sim-PROCESD provides class definitions for manufacturing devices/components that can be configured by the user to model various real-world manufacturing systems.

Tags: discrete-event simulation,manufacturing,production,maintenance,python

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Source: https://github.com/usnistgov/simprocesd

Data related to the investigation of UUIDs for a standards-based digital thread of product data in ISO 10303-242

Data provided by  National Institute of Standards and Technology

This dataset contains data used in the investigation of Universally Unique Identifiers (UUIDs) that will enable a standards-based digital thread of product data in ISO 10303-242. Included are EXPRESS schema used for implementation and .stp files that were exported from native CAD (CATIA V5, Creo, and NX). UUIDs were assigned to CAD features during .stp export for each of the four design iterations.

Tags: industrial data,standards,native CAD files,derived neutral files,ISO 10303,STEP,interoperability testing,digital thread,manufacturing,model-based enterprise,lifecycle,Universally Unique Identifiers,UUID,Persistent Identifiers,PID

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Source: https://github.com/usnistgov/UUID

Workshop Data on Autonomous Methodologies for Accelerating X-ray Measurements

Data provided by  National Institute of Standards and Technology

The National Institute of Standards and Technology and the International Centre for Diffraction Data co-hosted a workshop on 17-18 October 2023 to identify and prioritize the goals, challenges, and opportunities for critical and emerging technology needs within industry, with an emphasis on leveraging artificial intelligence, data-driven methodologies, and high-throughput and automated workflows for accelerating x-ray-based structural analysis for materials development and manufacturing.

Tags: Artificial Intelligence,machine learning,Autonomous Laboratories,diffraction,Materials Synthesis and Characterization,robotics

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