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X-ray Computed Tomography Experiments and Simulations of an Advanced Integrated Circuit Package
Data provided by National Institute of Standards and Technology
X-ray computed tomography (XCT) is a nondestructive method that uses multiple X-ray projections to create detailed 3D internal models of materials without damaging them. In the semiconductor industry, XCT is used for failure analysis, quality control, and process improvement. Integrated circuit (IC) packages can be inspected with XCT to detect failures and counterfeit components. However, there are limited data sets publicly available containing XCT measurements of advanced packages.
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Annual Integrated Economic Survey: All Sectors: Summary Statistics for Employer Firms in the U.S. and Selected Geographies: 1992 - 2023
Data provided by United States Census Bureau
The Annual Integrated Economic Survey (AIES) consolidates seven existing annual business surveys into one, replacing the Annual Capital Expenditures Survey, Annual Retail Trade Survey, Annual Survey of Manufacturers, Annual Wholesale Trade Survey, Manufacturer's Unfilled Orders Survey, Report of Organization, and Services Annual Survey. The AIES Historical Statistics dataset will provide historical content from the legacy surveys mixed with new data moving forward, using the North American Industry Classification System (NAICS).
Tags: census
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Source: http://api.census.gov/data/timeseries/aies/historical
NIST DART-MS Forensics Database (is-CID)
Data provided by National Institute of Standards and Technology
The NIST DART-MS Forensics Database is an evaluated collection of in-source collisionally-induced dissociation (is-CID) mass spectra of compounds of interest to the forensics community (e.g. seized drugs, cutting agents, etc.). The is-CID mass spectra were collected using Direct Analysis in Real-Time (DART) Mass Spectrometry (MS), either by NIST scientists or by contributing agencies noted per compound. The database is provided as a general-purpose structure data file (.SDF).
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X-ray Absorption and Resonant X-ray Emission at the Carbon Edge of Li2CO3
Data provided by National Institute of Standards and Technology
Data and input files for "X-ray Absorption and Resonant X-ray Emission at the Carbon Edge of Li_2CO_3".
Contents:
1. Inputs and outputs for calculations of ground-state DFT & GW are in the the ABI directory
2. Inputs and outputs for the MD simulations are in the MD directory
3. Inputs and outputs for the X-ray calculations are in the Xray directory
4. Experimental data are in the Expt directory
Plotting scripts for producing the figures are also included
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Two-color measurements supporting a revised formulation for the refractive index of air
Data provided by National Institute of Standards and Technology
Data and analysis supporting the article "Two-color measurements supporting a revised formulation for the refractive index of air," by PF Egan in Measurement Science and Technology (2026).
The measured data are in the files "data-GASNAME-2color.csv" where GASNAME is
* carbon dioxide
* oxygen
* bMixN787
* bMixN200
* dry air with a CO2 mole fraction of 388.86 ppm
* water
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Data associated with "Resolving magnetic-sublevel structure in Rydberg Autler-Townes spectra with arbitrary RF polarization"
Data provided by National Institute of Standards and Technology
We investigate the role of magnetic sublevels in Autler–Townes spectra of Rydberg atoms driven by radio-frequency (RF) fields with arbitrary polarization. While conventional treatments predict two symmetric sidebands from independent $m_J$ transitions, experiments have reported additional unexplained spectral features. We show that these arise from elliptical RF polarization, which coherently couples multiple magnetic sublevels and requires a full multi-level treatment.
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LQMetric/OpenLQM Quality of NIST Special Database 302h
Data provided by National Institute of Standards and Technology
This dataset contains the LQMetric and OpenLQM quality component values for the latent impression distal phalanx images of NIST Special Database (SD) 302h. OpenLQM is an open-source reimplementation of LQMetric, designed to keep computed values between the two software applications as identical as possible. All images of SD 302h were run through both the version of LQMetric included with Universal Latent Workstation v6.6.7 and OpenLQM v1.0.0 on a machine running Windows 11. The complete output for each software is available separately.
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Data for A Switchable Longitudinal & Shear BLS Microscope for Comprehensive Modulus Imaging of Semiconductor Packaging Materials
Data provided by National Institute of Standards and Technology
This dataset contains Brillouin light scattering (BLS) measurements collected using a custom-built switchable microscope and spectrometer platform. The microscope has two configurations: 1) a backscattered mode for high resolution longitudinal BLS measurements, and 2) an off-axis mode for longitudinal and shear measurements. The microscope can be used for comprehensive modulus imaging, including longitudinal modulus, Young's modulus, shear modulus, bulk modulus, and Poisson's ratio.
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Data for Revealing Statistically Robust Strain Rate Effects on the Mechanical Performance of Pristine Single Fiber Aramids
Data provided by National Institute of Standards and Technology
This dataset consists of experimental data from testing high strength fibers under four quasi-static rates (QS) on a single fiber test machine and under high-strain rate (HSR) on a single fiber Kolsky bar. Two poly-paraphenylene terephthalamide (PPTA) aramid fiber types were tested in the pristine condition. The data is first organized by material type in the main folder. Within the material type folder, they are organized by crosshead speed (for QS) or by the designation HSR (for Kolsky bar tests).
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Voice of Customer Data
Data provided by International Trade Administration
The Voice of Customer program shares customer feedback from various surveys, including the trade.gov digitial intercept and Global Markets' fee and non-fee services surveys for actionable insights and improvement efforts.
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