SRM 1548b electronic files containing the non-certified value and uncertainty, and the data used to assign that value. Certificate date 24 June 2024: Non-certified value for glyphosate added to Table A3; silicon value of potential interest moved to appendix B; updated format; editorial changes.

SRM 3122 Lot 230104 electronic files containing the certified value and uncertainty, and the data used to assigned that value.

This data comprises the information that was used to assign values, the assigned values themselves, and the associated uncertainties. Certificate date 20 May 2024.

This dataset contains raw mechanical data (strain, stress and strain rate curvesand initial temperatures) for compression experiments performed on aluminum alloy 6061-T6using the NIST pulse-heated Kolsky Bar at strain rates between 2400 1/s and 2700 1/s and initialtemperatures from 23 °C to 527 °C and heating times ranging between 0.2 s and 3.5 s. At this time,the thermal history of the specimen during heating is not included in the dataset but this informationmay be included in a future update.

Materials discovery and development necessarily begins with the preparation and identification of product phase(s). Crystalline compounds can be identified by their characteristic diffraction patterns using X-rays, neutrons, and or electrons. An estimated 20,000 X-ray diffractometers and a comparable number of electron microscopes are used daily in materials research and development laboratories for this purpose.