Contains the images of each patent grant issued weekly (Tuesdays) from July 31, 1790 to present in Portable Document Format (PDF) created from the Patent Grant Single-Page TIFF Images. Also included are older grants that have new Certificates-of-Correction (C-of-C) and rescanned images of older patent grants.

Contains the images of each patent grant issued weekly (Tuesdays) from July 31, 1790 to present in Tagged Image File Format (TIFF) Revision 6.0 with CCITT Group 4 Compression (single-page TIFFs). Includes a separate weekly Certificates-of-Correction (C-of-C) file and a daily Certificates file.

Contains recorded maintenance fee events for patents granted from September 1, 1981 to present. Each new weekly file is cumulative.

Contains bibliographic (front page) information, a representative claim, and a drawing (if applicable) of each patent grant issued that week. Includes U.S. Patent and Trademark Office Notices which provide important information and changes in rules concerning both patents and trademarks.

Contains bibliographic (front page) information and a representative drawing (if applicable) for each trademark registration or trademark application published that week. Incluides a list of cancelled and renewed registrations.

Contains bibliographic (front page) information and a representative drawing (if applicable) for each trademark registration or trademark application published that week. Incluides a list of cancelled and renewed registrations.

This dataset includes the position data of a two-dimensional gantry system experiment in which the G-code commands for the gantry were transmitted through a wireless communications link. The testbed is composed of four main components related to the operation of the gantry system. These components are the gantry system, the Wi-Fi network, the RF channel emulator, and the supervisory computer. In the experimental study, we run a scenario in which the gantry tool moves sequentially between four positions and has a preset dwell at each of the positions.

Materials discovery and development necessarily begins with the preparation and identification of product phase(s). Crystalline compounds can be identified by their characteristic diffraction patterns using X-rays, neutrons, and or electrons. An estimated 20,000 X-ray diffractometers and a comparable number of electron microscopes are used daily in materials research and development laboratories for this purpose.

This tool calculates metrics for investment analysis documented in NIST Advanced manufacturing Series 200-5. It calculates net present value, internal rate of return, and payback period along with executing sensitivity analysis using Monte Carlo techniques. The tool helps to identify the most economical projects/investments. For instance, it could be used to identify the most economical heating and cooling system or it might be used to rank a set of potential investments.

SRM 635a Portland Cement (Blended with Slag) - This Standard Reference Material (SRM) is intended primarily for use in validation of chemical and instrumental methods of analysis of cements and materials of similar matrix for elemental contents. It can be used to validate value assignment of in-house reference materials. This data is public in the Certificate of Analysis for this material.