The Manufacturing Cost Guide is a tool that estimates the costs that US manufacturers face and can be used to help gauge the potential returns on manufacturing industry research projects through cost reductions. These costs are grouped into various standardized categories such as the North American Industry Classification System (NAICS) and the Standard Occupational Classification (SOC) system along with other non-standardized costs.

The tool can be used to answer questions such as:

The QIF PMI Report (QPR) software generates a spreadsheet from a QIF (Quality Information Framework) file containing Product and Manufacturing Information (PMI). QIF is a unified XML framework standard for computer-aided quality QIF systems, available free to all implementers. QIF enables the capture, use, and re-use of metrology-related information throughout the Product Lifecycle Management (PLM) and Product Data Management (PDM) domains. QIF was created by the Digital Metrology Standards Consortium.

This data set is captured from a robot workcell that is performing activities representative of several manufacturing operations. The workcell contains two, 6-degree-of-freedom robot manipulators where one robot is performing material handling operations (e.g., transport parts into and out of a specific work space) while the other robot is performing a simulated precision operation (e.g., the robot touching the center of a part with a tool tip that leaves a mark on the part). This precision operation is intended to represent a precise manufacturing operation (e.g., welding, machining).

The NIST/ARPA-E Database of Novel and Emerging Adsorbent Materials is a free, web-based catalog of adsorbent materials and measured adsorption properties of numerous materials obtained from article entries from the scientific literature. Search fields for the database include adsorbent material, adsorbate gas, experimental conditions (pressure, temperature), and bibliographic information (author, title, journal), and results from queries are provided as a list of articles matching the search parameters.

NIST has created a Test System to measure conformance of Computer-Aided Design (CAD) software to American Society of Mechanical Engineers (ASME) standards for Product and Manufacturing Information (PMI), specifically geometric dimensioning and tolerancing (GD&T) information. The test system includes: test case definitions (2D CAD drawings with PMI), CAD models generated from the test cases, STEP files generated from the CAD models, and verification and validation reports.

Radio Frequency Measurements for Selected Manufacturing and Industrial Environments using a PN Code Sounding methodology. The resulting measurements include complex impulse responses and spectrum analysis traces. Complex impulse responses were validated using both ray tracing and an outdoor two-ray reference facility. This data is meant to serve as a reference of how radio waves at 2.4 GHz and 5 GHz propagate in industrial environments.

SRM 1297 Stainless Steel (SAE 201) - 'This Standard Reference Material (SRM) is intended for use in optical emission and x-ray spectrometric methods of analysis. It is in the form of a disk approximately 32 mm in diameter and 19 mm thick. This data is public in the Certificate of Analysis for this material.

Standard Reference Material 131h Refined Cast Iron - This Standard Reference Material (SRM) is intended primarily for use in validation of chemical and instrumental methods of analysis. It can be used to validate value assignment of in-house reference materials and, if necessary, to calibrate carbon/sulfur analyzers. A unit of SRM 131h consists of a bottle containing 100 g of chips. This data is public in the Certificate of Analysis for this material.

SRM 2452 Hydrogen in Titanium (Nominal Mass Fraction 60 mg/kg) - This Standard Reference Material (SRM) is intended for use in the evaluation of methods and the calibration of equipment used in the determination of hydrogen in titanium alloy. SRM 2452 consists of one bottle containing 10 g of titanium alloy chips. This data is public in the Certificate of Analysis for this material.