The NIST/ARPA-E Database of Novel and Emerging Adsorbent Materials is a free, web-based catalog of adsorbent materials and measured adsorption properties of numerous materials obtained from article entries from the scientific literature. Search fields for the database include adsorbent material, adsorbate gas, experimental conditions (pressure, temperature), and bibliographic information (author, title, journal), and results from queries are provided as a list of articles matching the search parameters.

Data for mass concentration analysis and spectral analysis for the paper titled, "Comparison of primary laser spectroscopy and mass spectrometry methods for measuring mass concentration of gaseous elemental mercury"

This tool calculates metrics for investment analysis documented in NIST Advanced manufacturing Series 200-5. It calculates net present value, internal rate of return, and payback period along with executing sensitivity analysis using Monte Carlo techniques. The tool helps to identify the most economical projects/investments. For instance, it could be used to identify the most economical heating and cooling system or it might be used to rank a set of potential investments.

The QIF PMI Report (QPR) software generates a spreadsheet from a QIF (Quality Information Framework) file containing Product and Manufacturing Information (PMI). QIF is a unified XML framework standard for computer-aided quality QIF systems, available free to all implementers. QIF enables the capture, use, and re-use of metrology-related information throughout the Product Lifecycle Management (PLM) and Product Data Management (PDM) domains. QIF was created by the Digital Metrology Standards Consortium.

This dataset includes the position data of a two-dimensional gantry system experiment in which the G-code commands for the gantry were transmitted through a wireless communications link. The testbed is composed of four main components related to the operation of the gantry system. These components are the gantry system, the Wi-Fi network, the RF channel emulator, and the supervisory computer. In the experimental study, we run a scenario in which the gantry tool moves sequentially between four positions and has a preset dwell at each of the positions.

This database allows the public to browse and search recent FTZ Board manufacturing approvals.

This tool is used to implement Monte Carlo analysis, which uses probabilistic sensitivity analysis to account for uncertainty. This tool is developed to follow the simulation segment of ASTM E1369. This technique involves a method of model sampling. Specification involves defining which variables are to be simulated, the distribution of each of these variables, and the number of iterations performed. The software then randomly samples from the probabilities for each input variable of interest. Three common distributions that are used include triangular, normal, and uniform.

The Manufacturing Cost Guide is a tool that estimates the costs that US manufacturers face and can be used to help gauge the potential returns on manufacturing industry research projects through cost reductions. These costs are grouped into various standardized categories such as the North American Industry Classification System (NAICS) and the Standard Occupational Classification (SOC) system along with other non-standardized costs.

The tool can be used to answer questions such as:

This data set is captured from a robot workcell that is performing activities representative of several manufacturing operations. The workcell contains two, 6-degree-of-freedom robot manipulators where one robot is performing material handling operations (e.g., transport parts into and out of a specific work space) while the other robot is performing a simulated precision operation (e.g., the robot touching the center of a part with a tool tip that leaves a mark on the part). This precision operation is intended to represent a precise manufacturing operation (e.g., welding, machining).

Materials discovery and development necessarily begins with the preparation and identification of product phase(s). Crystalline compounds can be identified by their characteristic diffraction patterns using X-rays, neutrons, and or electrons. An estimated 20,000 X-ray diffractometers and a comparable number of electron microscopes are used daily in materials research and development laboratories for this purpose.