Offers exclusive access to patent application status information for unpublished patent applications only to the applicant/inventor or his/her representative(s).

The 24 Hour Box zipfile contains images of daily Trademark applications in either JPG format (black and white, grayscale, or color) or TIFF format (black and white) processed through the Trademark Image Capture and Retrieval System (TICRS) and viewable using any standard image viewer. JPG images are accompanied by an XML file that contains text information about the application. TIFF images contain the application number embedded in the image (stamped prior to scan).

Pending and registered trademark text data (no images) to include word mark, serial number, registration number, filing date, registration date, goods and services, classification number(s), status code(s), and design search code(s).

Assignment (ownership) text data (no images).

Trademark Trial and Appeal Board (TTAB) text data (no images).

Contains detailed information on 7.0 million trademark applications filed with or registrations issued by the USPTO between 1870 and 2020.

Contains detailed information on 786,931 assignments and other transactions recorded at the USPTO between 1952 and 2020 and involving 1,491,485 million unique trademark properties.

This dataset includes the position data of a two-dimensional gantry system experiment in which the G-code commands for the gantry were transmitted through a wireless communications link. The testbed is composed of four main components related to the operation of the gantry system. These components are the gantry system, the Wi-Fi network, the RF channel emulator, and the supervisory computer. In the experimental study, we run a scenario in which the gantry tool moves sequentially between four positions and has a preset dwell at each of the positions.

Materials discovery and development necessarily begins with the preparation and identification of product phase(s). Crystalline compounds can be identified by their characteristic diffraction patterns using X-rays, neutrons, and or electrons. An estimated 20,000 X-ray diffractometers and a comparable number of electron microscopes are used daily in materials research and development laboratories for this purpose.

This tool calculates metrics for investment analysis documented in NIST Advanced manufacturing Series 200-5. It calculates net present value, internal rate of return, and payback period along with executing sensitivity analysis using Monte Carlo techniques. The tool helps to identify the most economical projects/investments. For instance, it could be used to identify the most economical heating and cooling system or it might be used to rank a set of potential investments.