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109 results found

Patent Grant Full Text Data with Embedded TIFF Images (2001 - Present) (Grant Red Book based on WIPO ST.36)

Data provided by  United States Patent and Trademark Office

Contains the full text, images/drawings, and complex work units (tables, mathematical expressions, chemical structures, and genetic sequence data) of each patent grant issued weekly (Tuesdays) from January 2, 2001 to present.

Tags: tuesday,uspto,sgml,xml,patent,grant,full text,chemical structures,complex work units,tables,genetic sequence,cals markup,mathml markup,mdl information systems mol files,mathematica notebook nb files,tiff,external cambridgesoft corp chemdraw cdx files,images,mathematical expressions,

Modified: 2024-02-22

Views: 0

Trademark Application Images (2009 - Present)

Data provided by  United States Patent and Trademark Office

The 24 Hour Box zipfile contains images of daily Trademark applications in either JPG format (black and white, grayscale, or color) or TIFF format (black and white) processed through the Trademark Image Capture and Retrieval System (TICRS) and viewable using any standard image viewer. JPG images are accompanied by an XML file that contains text information about the application. TIFF images contain the application number embedded in the image (stamped prior to scan).

Tags: 24,uspto,applicant,application,box,commerce,hour,image,jpeg,jpg,supplemental,tiff,trademark,xml,

Modified: 2024-02-22

Views: 0

Trademark Application XML (1884 - Present)

Data provided by  United States Patent and Trademark Office

Pending and registered trademark text data (no images) to include word mark, serial number, registration number, filing date, registration date, goods and services, classification number(s), status code(s), and design search code(s).

Tags: trademark,uspto,xml,application,classification number,design search code,filing date,goods and services,pending,registered,registration date,registration number,serial number,status code,word mark,

Modified: 2024-02-22

Views: 0

Trademark Assignment XML (1955 - Present)

Data provided by  United States Patent and Trademark Office

Assignment (ownership) text data (no images).

Tags: trademark,uspto,xml,application,assignment,change,ownership,pending,recordation,registered,text,

Modified: 2024-02-22

Views: 0

Trademark Trial and Appeal Board (TTAB) XML (1951 - Present)

Data provided by  United States Patent and Trademark Office

Trademark Trial and Appeal Board (TTAB) text data (no images).

Tags: ttab,trademark trial and appeal board,uspto,xml,application,pending,registered,text,

Modified: 2024-02-22

Views: 0

Measurement Dataset for A Wireless Gantry System

Data provided by  National Institute of Standards and Technology

This dataset includes the position data of a two-dimensional gantry system experiment in which the G-code commands for the gantry were transmitted through a wireless communications link. The testbed is composed of four main components related to the operation of the gantry system. These components are the gantry system, the Wi-Fi network, the RF channel emulator, and the supervisory computer. In the experimental study, we run a scenario in which the gantry tool moves sequentially between four positions and has a preset dwell at each of the positions.

Tags: wireless,manufacturing,cyber-physical systems,robotics,gantry,

Modified: 2024-02-22

Views: 0

NIST Inorganic Crystal Structure Database (ICSD)

Data provided by  National Institute of Standards and Technology

Materials discovery and development necessarily begins with the preparation and identification of product phase(s). Crystalline compounds can be identified by their characteristic diffraction patterns using X-rays, neutrons, and or electrons. An estimated 20,000 X-ray diffractometers and a comparable number of electron microscopes are used daily in materials research and development laboratories for this purpose.

Tags: chemical structures,crystallography,crystal structures,diffraction,disorder,electrons,identification,inorganic,neutrons,magnetic,metals,minerals,materials,Rietveld,synchrotron,twinned,x-rays,Advanced Materials,manufacturing,Safety,Security and Forensics,

Modified: 2024-02-22

Views: 0

Smart Investment Tool

Data provided by  National Institute of Standards and Technology

This tool calculates metrics for investment analysis documented in NIST Advanced manufacturing Series 200-5. It calculates net present value, internal rate of return, and payback period along with executing sensitivity analysis using Monte Carlo techniques. The tool helps to identify the most economical projects/investments. For instance, it could be used to identify the most economical heating and cooling system or it might be used to rank a set of potential investments.

Tags: net present value,internal rate of return,payback,investment,monte carlo,manufacturing,cost effective,economics,

Modified: 2024-02-22

Views: 0

SRM 3180 Iodide Anion (I-) Standard Solution

Data provided by  National Institute of Standards and Technology

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of iodide. A unit of SRM 3180 consists of five 5 mL, sealed, amber, borosilicate glass ampoules of solution prepared gravimetrically to contain a known mass fraction of iodide. The matrix of the solution is water containing sodium sulfite at a concentration of approximately 0.01 mol/L and sodium hydroxide at a concentration of approximately 0.005 mol/L. This data is public in the Certificate of Analysis for this material.

Tags: Standard Reference Material,SRM,iodide,anion,Advanced Materials,

Modified: 2024-02-22

Views: 0

SRM 3181 Sulfate Anion (SO42-) Standard Solution

Data provided by  National Institute of Standards and Technology

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of sulfate using anion ion chromatography (IC) or other methods. A unit of SRM 3181 consists of five 10 mL sealed borosilicate glass ampoules of solution prepared gravimetrically to contain a known mass fraction of sulfate dissolved in filtered (0.22 ?m) water having a minimum resistivity of 18 megaohm centimeters. This data is public in the Certificate of Analysis for this material.

Tags: Standard Reference Material,SRM,sulfate,anion,Advanced Materials,

Modified: 2024-02-22

Views: 0