U.S. flag

An official website of the United States government

Dot gov

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Https

Secure .gov websites use HTTPS
A lock () or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Breadcrumb

  1. Home

Dataset Search

Search results

73 results found

Patent Examination Data System (PEDS) API (Version 1.2.1)

Data provided by  United States Patent and Trademark Office

Patent Examination Data System lets customers retrieve and download multiple records of USPTO patent application or patent filing status at no cost. PEDS contains the bibliographic, published document and patent term extension data tabs in Public PAIR from 1981 to present. There is also some data dating back to 1935. Customers can download the entire dataset containing the data for all indexed documents. There are over 13 million records in PEDS. The data can be accessed by anyone using the web interface or the provided Application Programming Interface (API).

Tags: patent,published,patent application,examination,public,pair,json,xml,uspto,api,

Modified: 2024-02-22

Views: 0

Patent Grant Bibliographic Text (1976 - Present)

Data provided by  United States Patent and Trademark Office

Contains the bibliographic text (front page) of each patent grant issued weekly (Tuesdays) from January 6, 1976 to present (excludes images/drawings). Subset of the Patent Grant Full Text Data.

Tags: tuesday,uspto,ascii,sgml,xml,patent,grant,bibliographic,front page,text,

Modified: 2024-02-22

Views: 0

Patent Grant Full Text (1976 - Present)

Data provided by  United States Patent and Trademark Office

Contains the full text of each patent grant issued weekly (Tuesdays) from January 6, 1976 to present (excludes images/drawings). Subset of the Patent Grant Full Text Data with Embedded TIFF Images.

Tags: tuesday,uspto,ascii,sgml,xml,patent,grant,full text,chemical structures,complex work units,tables,genetic sequence,mathematical expressions,text,

Modified: 2024-02-22

Views: 0

Patent Grant Full Text Data with Embedded TIFF Images (2001 - Present) (Grant Red Book based on WIPO ST.36)

Data provided by  United States Patent and Trademark Office

Contains the full text, images/drawings, and complex work units (tables, mathematical expressions, chemical structures, and genetic sequence data) of each patent grant issued weekly (Tuesdays) from January 2, 2001 to present.

Tags: tuesday,uspto,sgml,xml,patent,grant,full text,chemical structures,complex work units,tables,genetic sequence,cals markup,mathml markup,mdl information systems mol files,mathematica notebook nb files,tiff,external cambridgesoft corp chemdraw cdx files,images,mathematical expressions,

Modified: 2024-02-22

Views: 0

Trademark Application Images (2009 - Present)

Data provided by  United States Patent and Trademark Office

The 24 Hour Box zipfile contains images of daily Trademark applications in either JPG format (black and white, grayscale, or color) or TIFF format (black and white) processed through the Trademark Image Capture and Retrieval System (TICRS) and viewable using any standard image viewer. JPG images are accompanied by an XML file that contains text information about the application. TIFF images contain the application number embedded in the image (stamped prior to scan).

Tags: 24,uspto,applicant,application,box,commerce,hour,image,jpeg,jpg,supplemental,tiff,trademark,xml,

Modified: 2024-02-22

Views: 0

Trademark Application XML (1884 - Present)

Data provided by  United States Patent and Trademark Office

Pending and registered trademark text data (no images) to include word mark, serial number, registration number, filing date, registration date, goods and services, classification number(s), status code(s), and design search code(s).

Tags: trademark,uspto,xml,application,classification number,design search code,filing date,goods and services,pending,registered,registration date,registration number,serial number,status code,word mark,

Modified: 2024-02-22

Views: 0

Trademark Assignment XML (1955 - Present)

Data provided by  United States Patent and Trademark Office

Assignment (ownership) text data (no images).

Tags: trademark,uspto,xml,application,assignment,change,ownership,pending,recordation,registered,text,

Modified: 2024-02-22

Views: 0

Trademark Trial and Appeal Board (TTAB) XML (1951 - Present)

Data provided by  United States Patent and Trademark Office

Trademark Trial and Appeal Board (TTAB) text data (no images).

Tags: ttab,trademark trial and appeal board,uspto,xml,application,pending,registered,text,

Modified: 2024-02-22

Views: 0

Measurement Dataset for A Wireless Gantry System

Data provided by  National Institute of Standards and Technology

This dataset includes the position data of a two-dimensional gantry system experiment in which the G-code commands for the gantry were transmitted through a wireless communications link. The testbed is composed of four main components related to the operation of the gantry system. These components are the gantry system, the Wi-Fi network, the RF channel emulator, and the supervisory computer. In the experimental study, we run a scenario in which the gantry tool moves sequentially between four positions and has a preset dwell at each of the positions.

Tags: wireless,manufacturing,cyber-physical systems,robotics,gantry,

Modified: 2024-02-22

Views: 0

NIST Inorganic Crystal Structure Database (ICSD)

Data provided by  National Institute of Standards and Technology

Materials discovery and development necessarily begins with the preparation and identification of product phase(s). Crystalline compounds can be identified by their characteristic diffraction patterns using X-rays, neutrons, and or electrons. An estimated 20,000 X-ray diffractometers and a comparable number of electron microscopes are used daily in materials research and development laboratories for this purpose.

Tags: chemical structures,crystallography,crystal structures,diffraction,disorder,electrons,identification,inorganic,neutrons,magnetic,metals,minerals,materials,Rietveld,synchrotron,twinned,x-rays,Advanced Materials,manufacturing,Safety,Security and Forensics,

Modified: 2024-02-22

Views: 0