The Annual Social and Economic Supplement or March CPS supplement is the primary source of detailed information on income and work experience in the United States. Numerous publications based on this survey are issued each year by the Bureaus of Labor Statistics and Census. A public-use microdata file is available for private researchers, who also produce many academic and policy-related documents based on these data.

This dataset will provide users with all geography levels for a given year as well as longitude/latitude and area (land and water) geographic information if available.

This zip file contains experimental data, refined configurations, and other necessary input to RMCProfile used in structural refinements reported in the paper "Emergent topological polarization textures in relaxor ferroelectrics" by M. Eremenko, V. Krayzman, S. Gorfman, A. Bosak, H. Y. Playford, P. A. Chater, B. Ravel, W. J. Laws, F. Ye, A. Minelli, B.-X. Wang, Z-G. Ye, M. G. Tucker, I. Levin.

HOTA-ReID is a modified version of the Higher Order Tracking Accuracy (HOTA) metric specifically designed to support Re-Identification (ReID) problems while providing significant performance improvements through parallel processing acceleration.

SIPP is a nationally representative longitudinal survey that provides comprehensive data about the income and government program participation of individuals and households in the United States. These microdata contain demographic and social characteristic information for each sample member, as well as detailed data on labor force activity, types and amounts of income, and participation in various cash and noncash benefit programs.

Data associated with "Frequency-doubled chirped-pulse dual-comb generation in the near-UV: Combined vs separated beam investigations of Rb atoms near 420 nm" accepted for publication in Scientific Reports (2025).

The dataset consists of six collections of SEM images, three trained U-net AI models, and CSV files with image quality metrics and trained AI model accuracy metrics. Each SEM image collection contains images augmented with Poisson noise and contrast.This work was performed with funding from the CHIPS Metrology Program, part of CHIPS for America, National Institute of Standards and Technology, U.S. Department of Commerce.

Dataset and workflow for the Construction of Amorphous Structure Models via Relaxation of Random Arrangements of Molecules. This is associated with manuscript "Construction of Amorphous Structure Models via Relaxation of Random Arrangements of Molecules" by Jarod Worden, Eric Cockayne, and Kevin F. Garrity. The primary investigated systems are silicon, SiO2, HfO2, ZrCu, and Al2O3.

Data for "Direct detection of the ∼ 8.4 eV internal conversion energy of 229mTh embedded in a superconducting nanowire"

The following optical micrograph data files are provided in support of the AM Bench 2018 modeling challenges associated with bare plate single track laser scans performed on the NIST Additive Manufacturing Metrology Testbed. These measurements were used in the AMB2018-02 set of challenges associated with track melt pool geometry (CHAL-AMB2018-02-MP).