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Patent Grant Single-Page TIFF Images (1790 - Present) (Grant Yellow Book 2 based on WIPO ST.33)

Data provided by  United States Patent and Trademark Office

Contains the images of each patent grant issued weekly (Tuesdays) from July 31, 1790 to present in Tagged Image File Format (TIFF) Revision 6.0 with CCITT Group 4 Compression (single-page TIFFs). Includes a separate weekly Certificates-of-Correction (C-of-C) file and a daily Certificates file.

Tags: tuesday,uspto,tiff,patent,grant,image,single-page,certificates,certificates-of-correction,reexaminations,rescans,

Modified: 2024-02-22

Views: 0

Patent Maintenance Fee Events (1981 - Present)

Data provided by  United States Patent and Trademark Office

Contains recorded maintenance fee events for patents granted from September 1, 1981 to present. Each new weekly file is cumulative.

Tags: tuesday,uspto,ascii,patent,grant,event code,maintenance fee,

Modified: 2024-02-22

Views: 0

Patent Official Gazettes (2002 - Present)

Data provided by  United States Patent and Trademark Office

Contains bibliographic (front page) information, a representative claim, and a drawing (if applicable) of each patent grant issued that week. Includes U.S. Patent and Trademark Office Notices which provide important information and changes in rules concerning both patents and trademarks.

Tags: tuesday,uspto,html,gif,patent grant,official,gazette,notices,

Modified: 2024-02-22

Views: 0

Trademark Official Gazettes (2013 - Present (searchable))

Data provided by  United States Patent and Trademark Office

Contains bibliographic (front page) information and a representative drawing (if applicable) for each trademark registration or trademark application published that week. Incluides a list of cancelled and renewed registrations.

Tags: tuesday,uspto,pdf,trademark,official,gazette,tmog,

Modified: 2024-02-22

Views: 0

Trademark Official Gazettes (2001 - 2021 Archive in PDF)

Data provided by  United States Patent and Trademark Office

Contains bibliographic (front page) information and a representative drawing (if applicable) for each trademark registration or trademark application published that week. Incluides a list of cancelled and renewed registrations.

Tags: tuesday,uspto,pdf,trademark,official,gazette,tmog,

Modified: 2024-02-22

Views: 0

NIST Inorganic Crystal Structure Database (ICSD)

Data provided by  National Institute of Standards and Technology

Materials discovery and development necessarily begins with the preparation and identification of product phase(s). Crystalline compounds can be identified by their characteristic diffraction patterns using X-rays, neutrons, and or electrons. An estimated 20,000 X-ray diffractometers and a comparable number of electron microscopes are used daily in materials research and development laboratories for this purpose.

Tags: chemical structures,crystallography,crystal structures,diffraction,disorder,electrons,identification,inorganic,neutrons,magnetic,metals,minerals,materials,Rietveld,synchrotron,twinned,x-rays,Advanced Materials,manufacturing,Safety,Security and Forensics,

Modified: 2024-02-22

Views: 0

SRM 3104a Barium (Ba) Standard Solution Lot No. 140909

Data provided by  National Institute of Standards and Technology

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of barium. A unit of SRM 3104a consists of five 10 mL sealed borosilicate glass ampoules of an acidified aqueous solution prepared gravimetrically to contain a known mass fraction of barium. The solution contains nitric acid at a volume fraction of approximately 1 %, which is equivalent to a concentration (molarity) of approximately 0.16 mol/L. This data is public in the Certificate of Analysis for this material.

Tags: barium,pure materials,cations,metals,single element solutions,spectrometry,Advanced Materials,

Modified: 2024-02-22

Views: 0

SRM 3110 Cerium (Ce) Standard Solution Lot No. 160830

Data provided by  National Institute of Standards and Technology

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of cerium. A unit of SRM 3110 consists of five 10 mL sealed borosilicate glass ampoules of an acidified aqueous solution prepared gravimetrically to contain a known mass fraction of cerium. The solution contains nitric acid at a mass fraction of approximately 16 %. This data is public in the Certificate of Analysis for this material.

Tags: cerium,pure materials,cations,metals,single element solutions,spectrometry,Advanced Materials,

Modified: 2024-02-22

Views: 0

SRM 3120a Germanium (Ge) Standard Solution Lot No. 080429

Data provided by  National Institute of Standards and Technology

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of germanium. A unit of SRM 3120a consists of 50 mL of a single element solution in a high density polyethylene bottle sealed in an aluminized bag. The solution was prepared gravimetrically to contain a known mass fraction of germanium. The solution contains nitric acid at a concentration of approximately 1.6 mol/L and hydrofluoric acid at a concentration of approximately 0.6 mol/L. This data is public in the Certificate of Analysis for this material.

Tags: germanium,pure materials,cations,metals,single element solutions,spectrometry,Advanced Materials,

Modified: 2024-02-22

Views: 0

SRM 3122 Hafnium (Hf) Standard Solution Lot No. 151120

Data provided by  National Institute of Standards and Technology

This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of hafnium. A unit of SRM 3122 consists of 50 mL of an acidified aqueous solution prepared gravimetrically to contain a known mass fraction of hafnium in a high density polyethylene bottle sealed in an aluminized bag. The solution contains approximately 8 % nitric acid (volume fraction) and approximately 1 % hydrofluoric acid (volume fraction), equivalent to amount of substance concentrations (molarities) of 1.3 mol/L and 0.3 mol/L, respectively.

Tags: hafnium,pure materials,cations,metals,single element solutions,spectrometry,Advanced Materials,

Modified: 2024-02-22

Views: 0