Data provided by National Institute of Standards and Technology
The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. All of it is collected and is stored in JSON files. The files are highly self-descriptive of their content, and contain angles, intensities, temperatures, and other environmental parameters, along with metadata.
About this Dataset
Updated: 2026-08-20
Metadata Last Updated:
2023-01-18 00:00:00
Date Created:
N/A
Data Provided by:
Dataset Owner:
N/A
| Title | Supplementary data from the NIST lattice comparator associated with paper "The NIST Silicon Lattice Comparator Upgrade" |
|---|---|
| Description | The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. All of it is collected and is stored in JSON files. The files are highly self-descriptive of their content, and contain angles, intensities, temperatures, and other environmental parameters, along with metadata. |
| Modified | 2023-01-18 00:00:00 |
| Publisher Name | National Institute of Standards and Technology |
| Contact | mailto:[email protected] |
| Keywords | Single crystal lattice standards; lattice comparator; delta-d; silicon |
{
"identifier": "ark:\/88434\/mds2-2913",
"accessLevel": "public",
"contactPoint": {
"hasEmail": "mailto:[email protected]",
"fn": "Marcus Mendenhall"
},
"programCode": [
"006:045"
],
"landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-2913",
"title": "Supplementary data from the NIST lattice comparator associated with paper \"The NIST Silicon Lattice Comparator Upgrade\"",
"description": "The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. All of it is collected and is stored in JSON files. The files are highly self-descriptive of their content, and contain angles, intensities, temperatures, and other environmental parameters, along with metadata.",
"language": [
"en"
],
"distribution": [
{
"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2913\/640g_silicon_example_data.zip",
"format": "zipped JSON files and python code",
"description": "JSON data files and python code to process them",
"mediaType": "application\/zip",
"title": "Example measurement of silicon lattice parameter"
},
{
"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2913\/calib.zip",
"format": "zipped file with historical angular calibration data",
"description": "Data files and python code used to process angular calibration data",
"mediaType": "application\/zip",
"title": "Calibration of angular interferometer"
},
{
"downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2913\/202106_EIB_interferometer_tests.zip",
"format": "zipped text files",
"description": "Dataset and python code used to measure periodic error in angular interferometer",
"mediaType": "application\/zip",
"title": "Interferometer short-period compensation data"
}
],
"bureauCode": [
"006:55"
],
"modified": "2023-01-18 00:00:00",
"publisher": {
"@type": "org:Organization",
"name": "National Institute of Standards and Technology"
},
"theme": [
"Materials:Materials characterization",
"Standards:Reference materials",
"Standards:Reference data"
],
"keyword": [
"Single crystal lattice standards; lattice comparator; delta-d; silicon"
]
}
