{
    "identifier": "ark:\/88434\/mds2-2913",
    "accessLevel": "public",
    "contactPoint": {
        "hasEmail": "mailto:[email protected]",
        "fn": "Marcus Mendenhall"
    },
    "programCode": [
        "006:045"
    ],
    "@type": "dcat:Dataset",
    "landingPage": "https:\/\/data.nist.gov\/od\/id\/mds2-2913",
    "description": "The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle.  All of it is collected and is stored in JSON files. The files are highly self-descriptive of their content, and contain angles, intensities, temperatures, and other environmental parameters, along with metadata.",
    "language": [
        "en"
    ],
    "title": "Supplementary data from the NIST  lattice comparator  associated with paper \"The NIST Silicon Lattice Comparator Upgrade\"",
    "distribution": [
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2913\/640g_silicon_example_data.zip",
            "format": "zipped JSON files and python code",
            "description": "JSON data files and python code to process them",
            "mediaType": "application\/zip",
            "title": "Example measurement of silicon lattice parameter"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2913\/calib.zip",
            "format": "zipped file with historical angular calibration data",
            "description": "Data files and python code used to process angular calibration data",
            "mediaType": "application\/zip",
            "title": "Calibration of angular interferometer"
        },
        {
            "downloadURL": "https:\/\/data.nist.gov\/od\/ds\/mds2-2913\/202106_EIB_interferometer_tests.zip",
            "format": "zipped text files",
            "description": "Dataset and python code used to measure periodic error in angular interferometer",
            "mediaType": "application\/zip",
            "title": "Interferometer short-period compensation data"
        }
    ],
    "license": "https:\/\/www.nist.gov\/open\/license",
    "bureauCode": [
        "006:55"
    ],
    "modified": "2023-01-18 00:00:00",
    "publisher": {
        "@type": "org:Organization",
        "name": "National Institute of Standards and Technology"
    },
    "accrualPeriodicity": "irregular",
    "theme": [
        "Materials:Materials characterization",
        "Standards:Reference materials",
        "Standards:Reference data"
    ],
    "issued": "2023-03-10",
    "keyword": [
        "Single crystal lattice standards; lattice comparator; delta-d; silicon"
    ]
}