Data provided by National Institute of Standards and Technology
This repository contains all of the data published in the figures of the paper "On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures." Manuscript DOI: 10.1109/JMW.2022.3232076Manuscript ID: JMW-2022-0108Manuscript Title: On-Wafer Vector-Network-Analyzer Measurements at mK TemperaturesPublished by: Institute of Electrical and Electronics Engineers (IEEE)
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Updated: 2025-09-09
Metadata Last Updated:
2022-10-22 00:00:00
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| Title | On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures |
|---|---|
| Description | This repository contains all of the data published in the figures of the paper "On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures." Manuscript DOI: 10.1109/JMW.2022.3232076Manuscript ID: JMW-2022-0108Manuscript Title: On-Wafer Vector-Network-Analyzer Measurements at mK TemperaturesPublished by: Institute of Electrical and Electronics Engineers (IEEE) |
| Modified | 2022-10-22 00:00:00 |
| Publisher Name | National Institute of Standards and Technology |
| Contact | mailto:[email protected] |
| Keywords | Microwave calibrations , on-wafer measurement , cryogenic , dilution refrigerator , vector network analysis. |
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