National Institute of Standards and Technology (NIST) public data inventory is a catalog of digital products generated from the NIST enterprise data inventory (EDI). The catalog is dynamically updated in coordination with mission goals for the dissemination of information for discovery and access. It includes digital products derived from multiple disciplines of scientific, engineering and technology areas of research and operation. This inventory is provided as a data.json file format, based on the DCAT-US Schema v1.1 standard definition.

Security automation reference data is currently housed within the National Vulnerability Database (NVD). The NVD is the U.S. Government repository of security automation data based on security automation specifications. This data provides a standards-based foundation for the automation of software asset, vulnerability, and security configuration management; security measurement; and compliance activities. This data supports security automation efforts based on the Security Content Automation Protocols (SCAP).

These data will appear in [1]. The abstract for that paper is given below:This paper presents a new multi-impedance-state line (MISL) in situ scattering parameter (S-parameter) calibration technique using on-chip superconducting transmission lines at 4 K that enables cryogenic calibration in a fixed signal path without the need for cryogenic switches or a cryogenic probe station. The method uses coplanar waveguide (CPW) models based on various impedance states of niobium (Nb), which has zero dc resistance below 9 K and a monotonically increasing resistance from 10 K to room temperature.

Dynamic Polymer Annotated Library (DPAL)DPAL is an annotated library of peer-reviewed research that aims to: (1) Fill a knowledge gap in the materials science field (2) Re-design a common medical field practice (the systematic literature search) to be more applicable and universal to materials design questions.

This zip file contains experimental data, refined configurations, and other necessary input to RMCProfile used in structural refinements reported in the paper "Emergent topological polarization textures in relaxor ferroelectrics" by M. Eremenko, V. Krayzman, S. Gorfman, A. Bosak, H. Y. Playford, P. A. Chater, B. Ravel, W. J. Laws, F. Ye, A. Minelli, B.-X. Wang, Z-G. Ye, M. G. Tucker, I. Levin.

HOTA-ReID is a modified version of the Higher Order Tracking Accuracy (HOTA) metric specifically designed to support Re-Identification (ReID) problems while providing significant performance improvements through parallel processing acceleration.

Data associated with "Frequency-doubled chirped-pulse dual-comb generation in the near-UV: Combined vs separated beam investigations of Rb atoms near 420 nm" accepted for publication in Scientific Reports (2025).

The dataset consists of six collections of SEM images, three trained U-net AI models, and CSV files with image quality metrics and trained AI model accuracy metrics. Each SEM image collection contains images augmented with Poisson noise and contrast.This work was performed with funding from the CHIPS Metrology Program, part of CHIPS for America, National Institute of Standards and Technology, U.S. Department of Commerce.

Dataset and workflow for the Construction of Amorphous Structure Models via Relaxation of Random Arrangements of Molecules. This is associated with manuscript "Construction of Amorphous Structure Models via Relaxation of Random Arrangements of Molecules" by Jarod Worden, Eric Cockayne, and Kevin F. Garrity. The primary investigated systems are silicon, SiO2, HfO2, ZrCu, and Al2O3.

Data for "Direct detection of the ∼ 8.4 eV internal conversion energy of 229mTh embedded in a superconducting nanowire"