Data directory name: "CHIPS-6-02-25-00-set"Material under study: Set contains twelve, 200 mm wafers, each with 65 cycles ofatomic layer deposition of hafnia, using an Arradiance* Gemstar XT ALD System, Serial Number: 08.164310262022. *Any mention of commercial products within NIST web pages is forinformation only; it does not imply recommendation or endorsement by NIST.Blank Si wafers purchased from WaferPro: [PartNo: F08041], SEMI standard, 200 mm, SSP, Prime, Float Zone, (100) orientation,with backside laser mark.

Most data generated are averaged heterodyne IQ voltages of a reflectometry of a superconducting cavity dispersively coupled to a transmon qubit, where the phase shift of the cavity probe tone is used to infer the qubit state. These data are collected while performing various parameter sweeps to track the qubit state evolution in response to various stimuli. There is also simulation data used to model qubit state evolution when driven with digital pulses.

Rydberg atoms, due to their large polarizabilities and strong transition dipole moments, have
emerged as powerful electric field sensors. While their capability to detect modulated signals has
been previously demonstrated, these studies have largely been limited to laboratory-generated signals tailored specifically for atomic detection. Here, we extend the practical applicability of Rydberg
sensors by demonstrating the reception of real-world frequency-modulated (FM) audio transmissions

This dataset contains results from a 2023-2024 survey of small manufacturers disseminated by the Performance of Emerging Technologies Project (PETR) within the Measurement Science for Robotics and Autonomous Systems Program. Data is completely anonymized but includes basic company demographics in addition to questions about specific task types that are currently automated or manual. Short answer responses regarding current automation challenges are also available. Additionally, survey statistics and analysis are included.

Supplemental material to the 2025 article "Demonstration of dispersion gas barometry" by Y. Yang, J.A. Stone, and P.F. Egan.

The archive file contains two-color data for the gases helium, neon, argon, and nitrogen. Two-color data means measured quadruplets of pressure and temperature together with refractivity at two wavelengths 1542.3912 nm (194.368624 THz) and 632.9919 nm (473.611873 THz).

Two analysis scripts are included:

RM 8231 electronic files containing values and the data used to assign them.

SysML2 models demonstrating computationally testable physical function modeling. These include reusable SysML2 libraries to facilitate functional modeling, as well as example applications of these libraries that include SysML2 graphic and textual representation .

Experimental results from conducted interference susceptibility experiments comparing interference impacts from three broad classes of interference waveforms: 1) synthetic 4G frequency division duplexing (FDD) uplink long term evolution (LTE) signals 2) recordings of real 4G FDD uplink LTE emissions from commercial off-the-shelf (COTS) hardware and 3) artificial pulse modulated noise (PMN). Two COTS communication systems were used as victim links, an IEEE 802.11n Wi-Fi link and a point-to-point (PTP) microwave link.

This data set provides the measurement data from EUV diffractometry, simulated fits to these data, and parametric values and uncertainties from these fits as first reported in Barnes et al., "Lab-based multi-wavelength EUV diffractometry for critical dimension metrology", Proc. SPIE 134261V (2025). These values and uncertainties for parametric geometries have been determined from these EUV diffractometry data using a tabletop coherent high- harmonic generation (HHG) source for four line-space arrays with CDs below 50 nm.

The following data files include mechanical behavior and corresponding X-ray diffraction measurement results associated with the 2022 Additive Manufacturing Benchmark test series (AM Bench) AMB2022-04 set of benchmarks. This set of benchmarks is a direct extension to the measurement data provided by an earlier set of benchmarks, AMB2018-01.