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Dioptra Test Platform

Data provided by  National Institute of Standards and Technology

Source code, documentation, and examples of use of the source code for the Dioptra Test Platform.

Dioptra is a software test platform for assessing the trustworthy characteristics of artificial intelligence (AI). Trustworthy AI is: valid and reliable, safe, secure and resilient, accountable and transparent, explainable and interpretable, privacy-enhanced, and fair - with harmful bias managed1. Dioptra supports the Measure function of the NIST AI Risk Management Framework by providing functionality to assess, analyze, and track identified AI risks.

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Source: https://github.com/usnistgov/dioptra

RGTM 10235: Forensic DNA Resource Samples Data

Data provided by  National Institute of Standards and Technology

RGTM 10235 is composed of eight well-quantified DNA extracts. Samples include three single-source samples, two degraded samples, and three mixture samples. RGTM 10235 allows the community to publicly share data generated, results of methods examined, and genetic profiles due to their informed consent.The capillary electrophoresis (CE) data which is hosted here was generated by NIST on a 3500xL Genetic Analyzer from Applied Biosystems with a 36 cm capillary array and POP-4 polymer.

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SRM 1548b Typical Diet

Data provided by  National Institute of Standards and Technology

SRM 1548b electronic files containing the non-certified value and uncertainty, and the data used to assign that value. Certificate date 24 June 2024: Non-certified value for glyphosate added to Table A3; silicon value of potential interest moved to appendix B; updated format; editorial changes.

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SRM 3122 Lot 230104 Hafnium (Hf) Standard Solution Data

Data provided by  National Institute of Standards and Technology

SRM 3122 Lot 230104 electronic files containing the certified value and uncertainty, and the data used to assigned that value.

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Using Near-Field Electromagnetic Side Channels for Efficiently Fingerprinting Wireless Modules

Data provided by  National Institute of Standards and Technology

This dataset is part of the article "Using Near-Field Electromagnetic Side Channels for Efficiently Fingerprinting Wireless Modules" intended for submission to IEEE PAINE 2024. 

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Long term drift of the baseline-corrected, Voltage to Frequency conversion factor, observed in a Commercial-Off-the-Shelf Voltage-Controlled Crystal Oscillator.

Data provided by  National Institute of Standards and Technology

Two column data of baseline-corrected sensitivity-drift (in units of PPM) of a Commercial-Off-the-Shelf VC/OCXO with respect to time (in units of years). The dataset spans about 0.7 years. Two spreadsheets are included in the workbook. The spreadsheet titled "Raw Data w. gaps 'as-collected'" contains the raw drift data, without any gap-filling. This shows the aging of a VC/OCXO's baseline-corrected sensitivity to constant input voltage.

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2-Hydroxybiphenyl: Experimental and Derived Thermodynamic Properties

Data provided by  National Institute of Standards and Technology

This document is part of a series of reports describing experimental property measurements completed at the National Institute for Petroleum and Energy Research (NIPER) in Bartlesville, Oklahoma, in the 1980s and 1990s. Members of the Bartlesville Thermodynamics Group included William D. "Bill" Good, William V. "Bill" Steele, Bruce E. Gammon, Norris K. Smith, Stephen E. Knipmeyer, An "Andy" Nguyen, Timothy D. Klots, I. A. "Alex" Hossenlopp, Aaron P. Rau, William B. Collier, John F. Messerly, Ann G. Osborn, Susan Lee-Bechtold, Donald G. Archer, Ian R.

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Measurement Quality Metrics to Improve Absolute Microbial Cell Counting

Data provided by  National Institute of Standards and Technology

This repository contains the raw data and analysis scripts supporting the associated publication which introduces a framework to help researchers select fit-for-purpose microbial cell counting methods and optimize protocols for quantification of microbial total cells and viable cells. Escherichia coli cells were enumerated using four methods (colony forming unit assay, impedance flow cytometry - Multisizer 4, impedance flow cytometry - BactoBox, and fluorescent flow cytometry - CytoFLEX LX) and repeated on multiple dates.

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Evaluation of static and dynamic magnetic properties of CoFeB versus thickness

Data provided by  National Institute of Standards and Technology

The enclosed dataset includes measurements of a thickness series of CoFeB thin film samples that were deposited at the NIST Magnetic Engineering Research Facility using magnetron sputtering. The thickness-dependent magnetic properties of CoFeB have significant technological relevance for predicting the read/write energy and speed of spin-transfer-torque magnetoresistive random access memory devices, which employ a nm-thick CoFeB film as the data storage layer.

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Test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz - Calnet

Data provided by  National Institute of Standards and Technology

The data are measurements of test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz. Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p, Ref_L1_g25_HF_0.s2p, Ref_S1_g25_HF_0.s2p, Ref_Rg_g25_HF_0.s2p, Ref_Og_g25_HF_0.s2p, Ref_L2_g25_HF_0.s2p, Ref_L3_g25_HF_0.s2p, Ref_L4_g25_HF_0.s2p, Ref_L5_g25_HF_0.s2p, Ref_L6_g25_HF_0.s2p, Ref_L7_g25_HF_0.s2p, Ref_L8_g25_HF_0.s2p, Ref_L9_g25_HF_0.s2p). Data is in an *.s2p format. The format is "# GHZ S RI R 50".

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