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Optically Distributing Remote Two-node Microwave Entanglement using Doubly Parametric Quantum Transducers
Data provided by National Institute of Standards and Technology
Data presented is part of the journal manuscript "Optically Distributing Remote Two-node Microwave Entanglement using Doubly Parametric Quantum Transducers." Data includes graphical plots generated from numerical models and computations for various network topologies which illustrate their thresholds for achieving quantum information transfer.
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Phase-Resolved Rydberg Atom Field Sensing using Quantum Interferometry
Data provided by National Institute of Standards and Technology
Although Rydberg atom-based electric field sensing provides key advantages over traditional antenna-based detection, it remains limited by the need for a local oscillator (LO) for low-field and phase resolved detection. In this work, we demonstrate the general applicability of closed-loop quantum interferometric schemes for Rydberg field sensing, which eliminate the need for an LO. We reveal that the quantum-interferometrically defined phase and frequency of our scheme provides an internal reference that enables LO-free full 360 degree-resolved phase sensitivity.
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Data for the article " Pseudo-resonant Detection of `Low Frequency' VHF Electric Fields via Rabi Matching with Autler-Townes Splitting in Rydberg Atoms"
Data provided by National Institute of Standards and Technology
This dataset represents absorption/transmission spectra of resonant probe light power through a Rydberg atom vapor, subject to a simultaneous dressing field and a 'low frequency' field. Data is taken as an oscilloscope average of 5 photodiode voltage traces, with frequency offsets given by a simultaneous reference cell (not included). Some data are given as 2-D arrays, with axes of laser detuning across a waterfall of field strength. Some data represents theory eigen-energies of the system, for comparison.
This paper will be submitted to Physical Review Letters.
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Data used in writing "Nanoscale bending dynamics in mixed-chain lipid membranes"
Data provided by National Institute of Standards and Technology
The files include dynamic light scattering (DLS), small angle neutron scattering (SANS), and neutron spin echo spectroscopy (NSE) data that were analyzed in writing the manuscript. The SANS data were collected on the NGB30 SANS and NG3 vSANS instruments at the NIST Center for Neutron Research (NCNR) and have been reduced to absolute intensity using standard procedures. The NSE data were collected on the NGA NSE instrument at the NCNR and have been corrected for the instrument resolution and solvent signal.
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Generator Fleet Characteristics Model
Data provided by National Institute of Standards and Technology
When run, the GFCM creates tabular and graphical data of the hourly operating status and market outcomes for the generators that make up the electric generating fleet.
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Forensic facial examiners vs. super-recognizers: Evaluating behavior beyond accuracy
Data provided by National Institute of Standards and Technology
This is the corresponding analysis script for the preprint paper, Forensic facial examiners vs. super-recognizers: Evaluating behavior beyond accuracy available from https://doi.org/10.1002/acp.4003.
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Trojan Detection Software Challenge - image-classification-sep2022-train
Data provided by National Institute of Standards and Technology
Round 11 Train Dataset
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Source: https://drive.google.com/drive/folders/1H38dLM4lXeGlPidms3TB2Y2Z38MOKcMy?usp=drive_link
Trojan Detection Software Challenge - image-classification-sep2022-test
Data provided by National Institute of Standards and Technology
Round 11 Test Dataset
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Source: https://drive.google.com/drive/folders/1RmFyI2lO2Sp7ofqRi7aZl7lhzbKMHgH5?usp=drive_link
Trojan Detection Software Challenge - image-classification-sep2022-holdout
Data provided by National Institute of Standards and Technology
Round 11 Holdout Dataset
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Source: https://drive.google.com/drive/folders/1pPTgPNmexKWuYuJqWyKnpLJJAZJ7jFTc?usp=drive_link
On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures
Data provided by National Institute of Standards and Technology
This repository contains all of the data published in the figures of the paper "On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures."
Manuscript DOI: 10.1109/JMW.2022.3232076
Manuscript ID: JMW-2022-0108
Manuscript Title: On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures
Published by: Institute of Electrical and Electronics Engineers (IEEE)
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