Dataset Search
Sort By
Search results
126526 results found
Foreign Trade Zones Annual Report to Congress
Data provided by International Trade Administration
Using data submitted by each zone, the FTZ Board prepares and submits a report annually to Congress summarizing activity conducted in foreign-trade zones throughout the year. The full report is available on the FTZ Board website.
Tags: foreign trade zone,FTZ,FTZ Board
Modified:
Source: http://enforcement.trade.gov/ftzpage/annual-report.html
Data Set: Assessment of Martensitic Transformation Paths Based on Transformation Potential Calculations
Data provided by National Institute of Standards and Technology
This data set supports the technical paper and supporting information documents accepted to Steel Research International (https://doi.org/10.1002/srin.201800370). The technical paper presents transformation potential calculations for two different martensitic transformation paths and compares these to experimentally measured textures in a SAE 201 stainless steel.
Tags: martensitic phase transformation,texture,neutron diffraction,austenitic steels,modeling
Modified:
3.5 GHz CBRS Federal Incumbent Protection Move Lists and Aggregate Interference Statistics
Data provided by National Institute of Standards and Technology
Simulated Citizens Broadband Radio Service device deployments, calculated federal incumbent protection move lists, and calculated aggregate interference statistics.
This data is associated with publication, "3.5 GHz Federal Incumbent Protection Algorithms," M. R. Souryal, T. T. Nguyen, and N. J. LaSorte, in Proc. IEEE DySPAN 2018, Oct. 2018.
Tags: 3.5 GHz,aggregate interference,CBRS,federal incumbent,move list
Modified:
NIST Inorganic Crystal Structure Database (ICSD)
Data provided by National Institute of Standards and Technology
Materials discovery and development necessarily begins with the preparation and identification of product phase(s). Crystalline compounds can be identified by their characteristic diffraction patterns using X-rays, neutrons, and or electrons. An estimated 20,000 X-ray diffractometers and a comparable number of electron microscopes are used daily in materials research and development laboratories for this purpose.
Tags: chemical structures,crystallography,crystal structures,diffraction,disorder,electrons,identification,inorganic,neutrons,magnetic,metals,minerals,materials,Rietveld,synchrotron,twinned,x-rays,Advanced Materials,manufacturing,Safety,Security and Forensics
Modified:
Source: https://icsd.nist.gov
ACS 5-Year Comparison Profiles
Data provided by United States Census Bureau
The American Community Survey (ACS) is an ongoing survey that provides data every year -- giving communities the current information they need to plan investments and services. The ACS covers a broad range of topics about social, economic, demographic, and housing characteristics of the U.S. population. The Comparison Profiles include the following geographies: nation, all states (including DC and Puerto Rico), all metropolitan areas, all congressional districts, all counties, all places and all tracts.
Tags: census
Modified:
Source: http://api.census.gov/data/2017/acs/acs5/cprofile
ACS 5-Year Data Profiles
Data provided by United States Census Bureau
The American Community Survey (ACS) is an ongoing survey that provides data every year -- giving communities the current information they need to plan investments and services. The ACS covers a broad range of topics about social, economic, housing, and demographic characteristics of the U.S. population. The ACS 5-year data profiles include the following geographies: nation, all states (including DC and Puerto Rico), all metropolitan areas, all congressional districts, all counties, all places and all tracts.
Tags: census
Modified:
Source: http://api.census.gov/data/2017/acs/acs5/profile
ACS 5-Year Subject Tables
Data provided by United States Census Bureau
The American Community Survey (ACS) is an ongoing survey that provides data every year -- giving communities the current information they need to plan investments and services. The ACS covers a broad range of topics about social, economic, demographic, and housing characteristics of the U.S. population. The subject tables include the following geographies: nation, all states (including DC and Puerto Rico), all metropolitan areas, all congressional districts, all counties, all places and all tracts. Subject tables provide an overview of the estimates available in a particular topic.
Tags: census
Modified:
Source: http://api.census.gov/data/2017/acs/acs5/subject
Time Series International Database 5-Year Age Groups and Sex and Other Demographic Variables
Data provided by United States Census Bureau
Midyear population estimates and projections for all countries and areas of the world with a population of 5,000 or more and selected subnational areas // Source: U.S. Census Bureau, Population Division, International Programs Center // Note: Total population available from 1950 to 2100 for 227 countries and areas. Other demographic variables available from base year to 2100. Base year varies by country and therefore data are not available for all years for all countries.
Tags: census
Modified:
Source: http://api.census.gov/data/timeseries/idb/5year
Time Series International Database: International Populations by Single Year of Age and Sex
Data provided by United States Census Bureau
Midyear population estimates and projections for all countries and areas of the world with a population of 5,000 or more // Source: U.S. Census Bureau, Population Division, International Programs Center// Note: Total population available from 1950 to 2100 for 227 countries and areas. Other demographic variables available from base year to 2100. Base year varies by country and therefore data are not available for all years for all countries.
Tags: census
Modified:
Source: http://api.census.gov/data/timeseries/idb/1year
Supporting Data for Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds
Data provided by National Institute of Standards and Technology
These are the unprocessed electron back scatter diffraction patterns (EBSPs) collected from the mesas of electron beam induced deposition (EBID) material, in addition to the Mathematica notebook used to process the images. Each of the 12 EBID mesa has 10 EBSPs collected at 20 kV and 10 kV, in addition to several longer line scans that step from the silicon substrate onto the EBID mesa.
Tags: Electron Back Scatter Diffraction,EBSD,flat field,background subtraction,Electron Beam Induced Deposition,EBID,Pt,W
Modified: