This Standard Reference Material (SRM) is intended for use as an analytical standard of known potassium (K) and chloride (Cl-) content. This lot of potassium chloride (KCl) was prepared to ensure a material of high purity and homogeneity and has been assayed after drying at 500 °C. A unit of SRM 999c consists of a single glass bottle containing 30 g of the material. This data is public in the Certificate of Analysis for this material.

Standard Reference Material-1721: Southern Oceanic Air. Ambient Nominal Amount of Substance Fraction for Carbon Dioxide, Methane & Nitrous Oxide. This Standard Reference Material (SRM) is a primary gas mixture for which the amount-of-substance fraction, expressed as concentration, may be related to secondary working standards. This SRM is intended for the calibration of instruments used for ambient carbon dioxide (CO2), methane (CH4) and nitrous oxide (N2O) determinations and for other applications. This data is public in the Certificate of Analysis for this material.

This Standard Reference Material (SRM) is intended for use as an analytical standard of known purity. It is intended primarily for use in the calibration and standardization of procedures for potassium (K) and chloride (Cl-) determinations employed in clinical analysis, including those using ion-selective electrodes, and for routine critical evaluation of the daily working standards used in these procedures. This lot of potassium chloride (KCl) was prepared to ensure a material of high purity and homogeneity and has been assayed after heating at 110 degrees C to 120 degrees C.

The Economic Development Administration's annual report to Congress documenting EDA's efforts to fulfil its mission of leading the federal economic development agenda in the fiscal year 2013

The Economic Development Administration's annual report to Congress documenting EDA's efforts to fulfil its mission of leading the federal economic development agenda in the fiscal year 2014

The Economic Development Administration's annual report to Congress documenting EDA's efforts to fulfil its mission of leading the federal economic development agenda in the fiscal year 2015

The Economic Development Administration's annual report to Congress documenting EDA's efforts to fulfil its mission of leading the federal economic development agenda in the fiscal year 2016

The Economic Development Administration's annual report to Congress documenting EDA's efforts to fulfil its mission of leading the federal economic development agenda in the fiscal year 2017

The Economic Development Administration's annual report to Congress documenting EDA's efforts to fulfil its mission of leading the federal economic development agenda in the fiscal year 2017

This MEMS Calculator determines the following thin film properties from data taken with an optical interferometer or comparable instrument: a) residual strain from fixed-fixed beams, b) strain gradient from cantilevers, c) step heights or thicknesses from step-height test structures, and d) in-plane lengths or deflections. Then, residual stress and stress gradient calculations can be made after an optical vibrometer or comparable instrument is used to obtain Young's modulus from resonating cantilevers or fixed-fixed beams.