Interlaboratory data from assessments of SRMs and other method comparison samples

The data in the ACerS-NIST Phase Equilibria Diagrams Database, jointly copyrighted by NIST and The American Ceramic Society, provide maps of the equilibrium chemical and structural behaviors exhibited by inorganic systems and provide critical starting information for the rational design of materials processing schemes, for quality assurance efforts, and for optimization of the physical and chemical properties of advanced materials. The contents of this database consist of approximately 25,000 equilibrium phase diagrams presented in 17,866 critically evaluated entries (PED Figures).

The objective of this shape retrieval contest is to retrieve 3D models those are relevant to a query range scan. This task corresponds to a real life scenario where the query is a 3D range scan of an object acquired from an arbitrary view direction. The algorithm should retrieve the relevant 3D objects from a database.

Task description:
In response to a given set of range scan queries, the task is to evaluate similarity scores with the target models and return an ordered ranked list along with the similarity scores for each query.

The Inorganic Crystal Structure Database (ICSD) is produced cooperatively by the Fachinformationszentrum Karlsruhe (FIZ) and the National Institute of Standards and Technology (NIST). Components and devices used in a broad spectrum of technology sectors such as health care, communications, energy and electronics are manufactured from crystalline materials; the development of advanced crystalline materials requires accurate crystal-structure data.

The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as islands, lines, spheres, and layered spheres on surfaces. As for earlier versions, such simulations can be performed for multilayer films. Users can specify the compositions and dimensions of each material in the sample structure as well as the measurement configuration. The database contains extensive physical data needed for quantitative interpretations of observed spectra.

This interactive database, maintained by the NIST Atomic Spectroscopy Data Center, contains more than 6000 references, dating from 1889 through current year and is updated regularly in intervals between one and four weeks. These references pertain to publications that include numerical data, general information, comments, and reviews on atomic line broadening and shifts.

This interactive database, maintained by the NIST Atomic Spectroscopy Data Center, contains more than 8000 references, dating from 1914 through current year and is updated regularly in intervals between one and four weeks. These references pertain to publications that include numerical data, comments, and reviews on atomic transition probabilities, oscillator strengths, line strengths, and radiative lifetimes.

References contained in this database are from Bibliography on Atomic Energy Levels and Spectra, NBS Special Publication 363 and Supplements, as well as current references since the last published bibliography collected by the NIST Atomic Spectroscopy Data Center (http://www.nist.gov/physlab/div842/grp01/asdc_info.cfm).

This website was designed to serve two purposes: 1) serve as a modern replacement for the original web site serving the content of NIST Special Publication 922: Polycyclic Aromatic Hydrocarbon Structure Index 2) serve thermochemical data derived in the publication 'First Principles Prediction of Enthalpies of Formation for Polycyclic Aromatic Hydrocarbons and Derivatives,' Thomas C. Allison and Donald R. Burgess Jr., manuscript in preparation.

This MEMS Calculator determines the following thin film properties from data taken with an optical interferometer or comparable instrument: a) residual strain from fixed-fixed beams, b) strain gradient from cantilevers, c) step heights or thicknesses from step-height test structures, and d) in-plane lengths or deflections. Then, residual stress and stress gradient calculations can be made after an optical vibrometer or comparable instrument is used to obtain Young's modulus from resonating cantilevers or fixed-fixed beams.